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Results: 1-11 |
Results: 11
Crystal-face dependence of low-energy ion scattering signals
Authors: Cortenraad, R Ermolov, SN Moest, B van der Gon, AWD Glebovsky, VG Brongersma, HH
Citation: R. Cortenraad et al., Crystal-face dependence of low-energy ion scattering signals, NUCL INST B, 174(1-2), 2001, pp. 173-180
Quantification of the surface composition of low-work function surfaces using low-energy ion scattering
Authors: Cortenraad, R van der Gon, AWD Brongersma, HH Ermolov, SN Glebovsky, VG
Citation: R. Cortenraad et al., Quantification of the surface composition of low-work function surfaces using low-energy ion scattering, SURF INT AN, 31(3), 2001, pp. 200-205
Electron-beam growing and purification of W crystals
Authors: Cortenraad, R Ermolov, SN Semenov, VN van der Gon, AWD Glebovsky, VG Bozhko, SI Stinov, ED Brongersma, HH
Citation: R. Cortenraad et al., Electron-beam growing and purification of W crystals, VACUUM, 62(2-3), 2001, pp. 181-188
Growth, characterisation and surface cleaning procedures for high-purity tungsten single crystals
Authors: Cortenraad, R Ermolov, SN Semenov, VN van der Gon, AWD Glebovsky, VG Bozhko, SI Brongersma, HH
Citation: R. Cortenraad et al., Growth, characterisation and surface cleaning procedures for high-purity tungsten single crystals, J CRYST GR, 222(1-2), 2001, pp. 154-162
Dynamic behavior of thermionic dispenser cathodes under ion bombardment
Authors: Cortenraad, R van der Gon, AWD Brongersma, HH Gartner, G Raasch, D Manenschijn, A
Citation: R. Cortenraad et al., Dynamic behavior of thermionic dispenser cathodes under ion bombardment, J APPL PHYS, 89(8), 2001, pp. 4354-4364
Cleaning procedure for single-crystal tungsten substrates
Authors: Cortenraad, R Ermolov, SN van der Gon, AWD Glebovskii, VG Brongersma, HH Manenschijn, A Gartner, G Belozerov, EV
Citation: R. Cortenraad et al., Cleaning procedure for single-crystal tungsten substrates, INORG MATER, 37(7), 2001, pp. 673-677
Investigation of extra clean single crystals of tungsten by methods of scattering of low energy ions, Auger spectroscopy, diffraction of low energy electrons and X-ray diffraction
Authors: Cortenraad, R Ermolov, SN van der Gon, AVD Semyonov, VN Brongersma, HH Glebovskiy, VG Bozhko, SJ
Citation: R. Cortenraad et al., Investigation of extra clean single crystals of tungsten by methods of scattering of low energy ions, Auger spectroscopy, diffraction of low energy electrons and X-ray diffraction, IAN FIZ, 64(4), 2000, pp. 691-697
In situ surface analysis by low energy ion scattering
Authors: van der Gon, AWD Cortenraad, R Jansen, WPA Reijme, MA Brongersma, HH
Citation: Awd. Van Der Gon et al., In situ surface analysis by low energy ion scattering, NUCL INST B, 161, 2000, pp. 56-64
Influence of analyser transmission and detection efficiency on the energy dependence of low-energy ion scattering signals
Authors: Cortenraad, R van der Gon, AW Brongersma, HH
Citation: R. Cortenraad et al., Influence of analyser transmission and detection efficiency on the energy dependence of low-energy ion scattering signals, SURF INT AN, 29(8), 2000, pp. 524-534
Quantitative LEIS analysis of thermionic dispenser cathodes
Authors: Cortenraad, R van der Gon, AWD Brongersma, HH Gartner, G Manenschijn, A
Citation: R. Cortenraad et al., Quantitative LEIS analysis of thermionic dispenser cathodes, APPL SURF S, 146(1-4), 1999, pp. 69-74
Growth and characterization of monocrystalline tungsten substrates
Authors: Ermolov, SN Cortenraad, R Semenov, VN van der Gon, AWD Bozhko, SI Brongersma, HH Glebovsky, VG
Citation: Sn. Ermolov et al., Growth and characterization of monocrystalline tungsten substrates, VACUUM, 53(1-2), 1999, pp. 83-86
Risultati: 1-11 |