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Results:
1-8
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Results: 8
Authors:
Salviati, G
Armani, N
Cova, P
Meneghesso, G
Zanoni, E
Citation: G. Salviati et al., Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs, MAT SCI E B, 80(1-3), 2001, pp. 289-293
Authors:
Pirondi, A
Nicoletto, G
Cova, P
Pasqualetti, M
Portesine, M
Citation: A. Pirondi et al., Thermo-mechanical finite element analysis in press-packed IGBT design, MICROEL REL, 40(7), 2000, pp. 1163-1172
Authors:
Nicoletto, G
Pirondi, A
Cova, P
Citation: G. Nicoletto et al., Accelerated life testing and thermomechanical simulation in power electronic device development, J STRAIN A, 34(6), 1999, pp. 455-462
Authors:
Cova, P
Meneghesso, G
Salviati, G
Zanoni, E
Citation: P. Cova et al., Cathodoluminescence from hot electron stressed InPHEMTs, MICROEL REL, 39(6-7), 1999, pp. 1073-1078
Authors:
Ciappa, M
Malberti, P
Fichtner, W
Cova, P
Cattani, L
Fantini, F
Citation: M. Ciappa et al., Lifetime extrapolation for IGBT modules under realistic operation conditions, MICROEL REL, 39(6-7), 1999, pp. 1131-1136
Authors:
Cova, P
Nicoletto, G
Pirondi, A
Portesine, M
Pasqualetti, M
Citation: P. Cova et al., Power cycling on press-pack IGBTs: measurements and thermomechanical simulation, MICROEL REL, 39(6-7), 1999, pp. 1165-1170
Authors:
Cova, P
Singh, A
Masut, RA
Citation: P. Cova et al., Simultaneous analysis of current-voltage and capacitance-voltage characteristics of metal-insulator-semiconductor diodes with a high mid-gap trap density, J APPL PHYS, 85(9), 1999, pp. 6530-6538
Authors:
Pirondi, A
Nicoletto, G
Cova, P
Pasqualetti, M
Portesine, M
Zani, PE
Citation: A. Pirondi et al., Thermo-mechanical simulation of a multichip press-packed IGBT, SOL ST ELEC, 42(12), 1998, pp. 2303-2307
Risultati:
1-8
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