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Results: 1-8 |
Results: 8

Authors: Ma, ZQ Bhattacharya, P Rieh, JS Ponchak, GE Alterovitz, SA Croke, ET
Citation: Zq. Ma et al., Reliability of microwave SiGe/Si heterojunction bipolar transistors, IEEE MICR W, 11(10), 2001, pp. 401-403

Authors: Christofferson, J Vashaee, D Shakouri, A Melese, P Fan, XF Zeng, GH Labounty, C Bowers, JE Croke, ET
Citation: J. Christofferson et al., Thermoreflectance imaging of superlattice micro refrigerators, P IEEE SEM, 2001, pp. 58-62

Authors: Qasaimeh, O Ma, ZQ Bhattacharya, P Croke, ET
Citation: O. Qasaimeh et al., Monolithically integrated multichannel SiGe/Si p-i-n-HBT photoreceiver arrays, J LIGHTW T, 18(11), 2000, pp. 1548-1553

Authors: Shivaram, R Niu, GF Cressler, JD Croke, ET
Citation: R. Shivaram et al., The effect of carbon content on the minority carrier lifetime in lattice-matched p(+)-Si/p-SiGeC/n-Si/n(+)-Si diodes, SOL ST ELEC, 44(3), 2000, pp. 559-563

Authors: Kuznetsov, VV Mendez, EE Zuo, X Snider, GL Croke, ET
Citation: Vv. Kuznetsov et al., Partially suppressed shot noise in hopping conduction: Observation in SiGequantum wells, PHYS REV L, 85(2), 2000, pp. 397-400

Authors: Rieh, JS Bhattacharya, PK Croke, ET
Citation: Js. Rieh et al., Temperature dependent minority electron mobilities in strained Si1-xGex (0.2 <= x <= 0.4) layers, IEEE DEVICE, 47(4), 2000, pp. 883-890

Authors: Croke, ET Grosse, F Vajo, JJ Gyure, MF Floyd, M Smith, DJ
Citation: Et. Croke et al., Substitutional C fraction and the influence of C on Si dimer diffusion in Si1-yCy alloys grown on (001) and (118) Si, APPL PHYS L, 77(9), 2000, pp. 1310-1312

Authors: Stein, BL Yu, ET Croke, ET Hunter, AT Laursen, T Mayer, JW Ahn, CC
Citation: Bl. Stein et al., Deep-level transient spectroscopy of Si/Si1-x-y GexCy heterostructures, APPL PHYS L, 73(5), 1999, pp. 647-649
Risultati: 1-8 |