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Results: 1-10 |
Results: 10
A FRICTION FORCE MICROSCOPE EMPLOYING LASER-BEAM DEFLECTION FOR FORCEDETECTION
Authors: LU XC WEN SZ MENG TG HUANG P DAI CC HUANG GZ WANG PS BAI CL
Citation: Xc. Lu et al., A FRICTION FORCE MICROSCOPE EMPLOYING LASER-BEAM DEFLECTION FOR FORCEDETECTION, Chinese Science Bulletin, 41(22), 1996, pp. 1873-1876
A FRICTION FORCE MICROSCOPY STUDY ON THE SURFACE OF AU FILM, CD-DISK AND LB FILM
Authors: LU XC WEN SZ LUO JB ZHAO L DAI CC ZHANG PC BAI CL
Citation: Xc. Lu et al., A FRICTION FORCE MICROSCOPY STUDY ON THE SURFACE OF AU FILM, CD-DISK AND LB FILM, Chinese Science Bulletin, 41(11), 1996, pp. 900-903
IPSO NITRATION AND BROMINATION OF THE MUL TISUBSTITUTED BENZENE
Authors: YU ZH ZHENG WC JIANG MQ DAI CC
Citation: Zh. Yu et al., IPSO NITRATION AND BROMINATION OF THE MUL TISUBSTITUTED BENZENE, Gaodeng xuexiao huaxue xuebao, 16(10), 1995, pp. 1544-1549
NEWLY DEVELOPED LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE AND ITSAPPLICATION TO THE STUDY OF SUPERCONDUCTING MATERIALS
Authors: GAO F DAI CC CHEN ZB HUANG GZ BAI CL TAO HG YIN B YANG QS ZHAO ZX
Citation: F. Gao et al., NEWLY DEVELOPED LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE AND ITSAPPLICATION TO THE STUDY OF SUPERCONDUCTING MATERIALS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1708-1711
MICROSTRUCTURE OF NANOSIZE HYDROGENATED CRYSTALLINE SILICON STUDIED BY SCANNING-TUNNELING-MICROSCOPY
Authors: BAI CL WANG ZH DAI CC ZHANG PC HE YL
Citation: Cl. Bai et al., MICROSTRUCTURE OF NANOSIZE HYDROGENATED CRYSTALLINE SILICON STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1823-1826
HEI PHOTOELECTRON SPECTROSCOPIC STUDY OF THE ELECTRONIC-STRUCTURE IN SOME FORKED CONJUGATIVE SYSTEMS
Authors: WANG DX ZHENG SJ CAI XH MENG LP DAI CC XU GZ PEEL JB
Citation: Dx. Wang et al., HEI PHOTOELECTRON SPECTROSCOPIC STUDY OF THE ELECTRONIC-STRUCTURE IN SOME FORKED CONJUGATIVE SYSTEMS, Chinese Science Bulletin, 39(5), 1994, pp. 391-396
HEI PHOTOELECTRON SPECTROSCOPIC STUDY OF ALPHA-CYANO OMEGA-HETEROCYCLIC POLYENIC NITRILES
Authors: WANG DX ZHENG SJ MENG LP CAI XH DAI CC XU GZ PEEL JB
Citation: Dx. Wang et al., HEI PHOTOELECTRON SPECTROSCOPIC STUDY OF ALPHA-CYANO OMEGA-HETEROCYCLIC POLYENIC NITRILES, Chinese Science Bulletin, 38(21), 1993, pp. 1784-1789
IMAGING OF MICA AND GRAPHITE SURFACES WITH THE LASER-AFM
Authors: WU JH CHENG YJ DAI CC HUANG GZ XIE YC GONG LS BAI CL
Citation: Jh. Wu et al., IMAGING OF MICA AND GRAPHITE SURFACES WITH THE LASER-AFM, Chinese Science Bulletin, 38(19), 1993, pp. 1621-1622
ATOMIC-FORCE MICROSCOPES EMPLOYING LASER-BEAM DEFLECTION FOR FORCE DETECTION
Authors: WU JH CHENG YJ DAI CC HUANG GZ XIE YC GONG LS BAI CL
Citation: Jh. Wu et al., ATOMIC-FORCE MICROSCOPES EMPLOYING LASER-BEAM DEFLECTION FOR FORCE DETECTION, Chinese Science Bulletin, 38(19), 1993, pp. 1623-1625
MECHANISM FOR THE NANOMETER-SCALE MODIFICATION ON HOPG SURFACE BY SCANNING TUNNELING MICROSCOPE
Authors: WANG ZH DAI CC ZHANG PC HUANG GZ LI RL GUO Y BAI CL
Citation: Zh. Wang et al., MECHANISM FOR THE NANOMETER-SCALE MODIFICATION ON HOPG SURFACE BY SCANNING TUNNELING MICROSCOPE, Chinese Physics Letters, 10(9), 1993, pp. 535-538
Risultati: 1-10 |