Authors:
PIC C
MARTIN D
GUILMENT J
DEFORNEL F
GOUDONNET JP
Citation: C. Pic et al., SPECTROSCOPIC STUDY OF A SPECTRALLY SENSITIZED TABULAR GRAIN AGBR EMULSION USING BOTH AFM AND PSTM TECHNIQUES, Journal of imaging science and technology, 42(2), 1998, pp. 126-134
Authors:
CHAUMET PC
RAHMANI A
DEFORNEL F
DUFOUR JP
Citation: Pc. Chaumet et al., EVANESCENT LIGHT-SCATTERING - THE VALIDITY OF THE DIPOLE APPROXIMATION, Physical review. B, Condensed matter, 58(4), 1998, pp. 2310-2315
Citation: A. Rahmani et al., FIELD PROPAGATOR OF A DRESSED JUNCTION - FLUORESCENCE LIFETIME CALCULATIONS IN A CONFINED GEOMETRY, Physical review. A, 56(4), 1997, pp. 3245-3254
Citation: L. Salomon et F. Defornel, APPLICATIONS OF NEAR-FIELD OPTICS TO THE CHARACTERIZATION OF OPTOELECTRONICS COMPONENTS, Annales des telecommunications, 52(11-12), 1997, pp. 594-612
Authors:
CERRE N
DEFORNEL F
GOUDONNET JP
LADAN PR
GUERRIN P
Citation: N. Cerre et al., SPATIAL SPECTROSCOPY WITH THE REFLECTION SCANNING MICROSCOPE, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(7), 1996, pp. 1357-1361
Citation: Jc. Weeber et al., COMPUTATION OF THE FIELD DIFFRACTED BY A LOCAL SURFACE DEFECT - APPLICATION TO TIP-SAMPLE INTERACTION IN THE PHOTON SCANNING TUNNELING MICROSCOPE, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(5), 1996, pp. 944-951
Authors:
DEFORNEL F
ADAM PM
SALOMON L
GOUDONNET JP
SENTENAC A
CARMINATI R
GREFFET JJ
Citation: F. Defornel et al., ANALYSIS OF IMAGE-FORMATION WITH A PHOTON SCANNING TUNNELING MICROSCOPE, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(1), 1996, pp. 35-45
Citation: A. Rahmani et F. Defornel, NEAR-FIELD OPTICAL PROBING OF FLUORESCENT MICROSPHERES USING A PHOTONSCANNING TUNNELING MICROSCOPE, Optics communications, 131(4-6), 1996, pp. 253-259
Citation: Jc. Weeber et al., NUMERICAL STUDY OF THE TIP-SAMPLE INTERACTION IN THE PHOTON SCANNING TUNNELING MICROSCOPE, Optics communications, 126(4-6), 1996, pp. 285-292
Authors:
GOUDONNET JP
BOURILLOT E
ADAM PM
DEFORNEL F
SALOMON L
VINCENT P
NEVIERE M
FERRELL TL
Citation: Jp. Goudonnet et al., IMAGING OF TEST QUARTZ GRATINGS WITH A PHOTON SCANNING TUNNELING MICROSCOPE - EXPERIMENT AND THEORY, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(8), 1995, pp. 1749-1764
Authors:
BOURILLOT E
DEFORNEL F
GOUDONNET JP
PERSEGOL D
KEVORKIAN A
DELACOURT D
Citation: E. Bourillot et al., ANALYSIS OF PHOTON-SCANNING TUNNELING MICROSCOPE IMAGES OF INHOMOGENEOUS SAMPLES - DETERMINATION OF THE LOCAL REFRACTIVE-INDEX OF CHANNEL WAVE-GUIDES, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(1), 1995, pp. 95-106
Authors:
DAWSON P
SMITH KW
DEFORNEL F
GOUDONNET JP
Citation: P. Dawson et al., IMAGING OF SURFACE-PLASMON LAUNCH AND PROPAGATION USING A PHOTON SCANNING TUNNELING MICROSCOPE, Ultramicroscopy, 57(2-3), 1995, pp. 287-292
Authors:
HOSAIN SI
MEUNIER JP
BOURILLOT E
DEFORNEL F
GOUDONNET JP
Citation: Si. Hosain et al., REVIEW OF THE BASIC METHODS FOR CHARACTERIZING INTEGRATED-OPTIC WAVE-GUIDES, Fiber and integrated optics, 14(1), 1995, pp. 89-107
Authors:
WEEBER JC
DEFORNEL F
SALOMON L
BOURILLOT E
ADAM P
GOUDONNET JP
Citation: Jc. Weeber et al., COMPUTATION OF NEAR-FIELD DIFFRACTION BY A DIELECTRIC GRATING - A COMPARISON WITH EXPERIMENTS, Optics communications, 119(1-2), 1995, pp. 23-29
Citation: Si. Hosain et al., CHARACTERIZATION OF SINGLE-MODE GRADED-INDEX FIBERS - A NEW METHOD BASED ON TRANSVERSE OFFSET SPLICE LOSS, Microwave and optical technology letters, 7(7), 1994, pp. 301-304
Authors:
DEFORNEL F
ADAM PM
SALOMON L
GOUDONNET JP
GUERIN P
Citation: F. Defornel et al., EFFECT OF COHERENCE OF THE SOURCE ON THE IMAGES OBTAINED WITH A PHOTON SCANNING TUNNELING MICROSCOPE, Optics letters, 19(14), 1994, pp. 1082-1084
Citation: P. Dawson et al., IMAGING OF SURFACE-PLASMON PROPAGATION AND EDGE INTERACTION USING A PHOTON SCANNING TUNNELING MICROSCOPE, Physical review letters, 72(18), 1994, pp. 2927-2930
Authors:
CHABRIER G
DEFORNEL F
BOURILLOT E
SALOMON L
GOUDONNET JP
Citation: G. Chabrier et al., A DARK-FIELD PHOTON SCANNING TUNNELING MICROSCOPE UNDER INCOHERENT-LIGHT ILLUMINATION, Optics communications, 107(5-6), 1994, pp. 347-352
Citation: N. Cerre et al., REFLECTION SCANNING MICROSCOPE - INFLUENCE OF THE DISTANCE AND THE ORIENTATION BETWEEN THE FIBER AND THE SAMPLE, Journal of the Optical Society of America. A: Optics and image science, 10(9), 1993, pp. 1909-1917
Authors:
DEFORNEL F
LESNIEWSKA E
SALOMON L
GOUDONNET JP
Citation: F. Defornel et al., 1ST IMAGES OBTAINED IN THE NEAR-INFRARED SPECTRUM WITH THE PHOTON SCANNING TUNNELING MICROSCOPE, Optics communications, 102(1-2), 1993, pp. 1-5