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Results: 1-11 |
Results: 11
IN-SITU ULTRASONIC MEASUREMENT OF PHOTORESIST GLASS-TRANSITION TEMPERATURE
Authors: MORTON SL DEGERTEKIN FL KHURIYAKUB BT
Citation: Sl. Morton et al., IN-SITU ULTRASONIC MEASUREMENT OF PHOTORESIST GLASS-TRANSITION TEMPERATURE, Applied physics letters, 72(19), 1998, pp. 2457-2459
MICROMACHINABLE ULTRASONIC LEAKY-WAVE AIR TRANSDUCERS
Authors: DEGERTEKIN FL ATALAR A KHURIYAKUB BT
Citation: Fl. Degertekin et al., MICROMACHINABLE ULTRASONIC LEAKY-WAVE AIR TRANSDUCERS, Applied physics letters, 73(6), 1998, pp. 741-743
IN-SITU ULTRASONIC MONITORING OF PHOTORESIST DEVELOPMENT
Authors: MORTON SL DEGERTEKIN FL KHURIYAKUB BT
Citation: Sl. Morton et al., IN-SITU ULTRASONIC MONITORING OF PHOTORESIST DEVELOPMENT, Applied physics letters, 73(15), 1998, pp. 2215-2217
MICROMACHINED 2-DIMENSIONAL ARRAY PIEZOELECTRICALLY ACTUATED TRANSDUCERS
Authors: PERCIN G ATALAR A DEGERTEKIN FL KHURIYAKUB BT
Citation: G. Percin et al., MICROMACHINED 2-DIMENSIONAL ARRAY PIEZOELECTRICALLY ACTUATED TRANSDUCERS, Applied physics letters, 72(11), 1998, pp. 1397-1399
LAMB WAVE EXCITATION BY HERTZIAN CONTACTS WITH APPLICATIONS IN NDE
Authors: DEGERTEKIN FL KHURIYAKUB BT
Citation: Fl. Degertekin et Bt. Khuriyakub, LAMB WAVE EXCITATION BY HERTZIAN CONTACTS WITH APPLICATIONS IN NDE, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 44(4), 1997, pp. 769-779
IN-SITU MONITORING OF CRYSTALLINITY AND TEMPERATURE DURING RAPID THERMAL CRYSTALLIZATION OF SILICON ON GLASS
Authors: SUBRAMANIAN V DEGERTEKIN FL DANKOSKI P KHURIYAKUB BT SARASWAT KC
Citation: V. Subramanian et al., IN-SITU MONITORING OF CRYSTALLINITY AND TEMPERATURE DURING RAPID THERMAL CRYSTALLIZATION OF SILICON ON GLASS, Journal of the Electrochemical Society, 144(6), 1997, pp. 2216-2221
SINGLE-MODE LAMB WAVE EXCITATION IN THIN PLATES BY HERTZIAN CONTACTS
Authors: DEGERTEKIN FL KHURIYAKUB BT
Citation: Fl. Degertekin et Bt. Khuriyakub, SINGLE-MODE LAMB WAVE EXCITATION IN THIN PLATES BY HERTZIAN CONTACTS, Applied physics letters, 69(2), 1996, pp. 146-148
HERTZIAN CONTACT TRANSDUCERS FOR NONDESTRUCTIVE EVALUATION
Authors: DEGERTEKIN FL KHURIYAKUB BT
Citation: Fl. Degertekin et Bt. Khuriyakub, HERTZIAN CONTACT TRANSDUCERS FOR NONDESTRUCTIVE EVALUATION, The Journal of the Acoustical Society of America, 99(1), 1996, pp. 299-308
IN-SITU THIN-FILM THICKNESS MEASUREMENT WITH ACOUSTIC LAMB WAVES
Authors: PEI J DEGERTEKIN FL KHURIYAKUB BT SARASWAT KC
Citation: J. Pei et al., IN-SITU THIN-FILM THICKNESS MEASUREMENT WITH ACOUSTIC LAMB WAVES, Applied physics letters, 66(17), 1995, pp. 2177-2179
RAPID THERMAL MULTIPROCESSING FOR A PROGRAMMABLE FACTORY FOR ADAPTABLE MANUFACTURING OF ICS
Authors: SARASWAT KC APTE PP BOOTH L CHEN YZ DANKOSKI PCP DEGERTEKIN FL FRANKLIN GF KHURIYAKUB BT MOSLEHI MM SCHAPER C GYUGYI PJ LEE YJ PEI J WOOD SC
Citation: Kc. Saraswat et al., RAPID THERMAL MULTIPROCESSING FOR A PROGRAMMABLE FACTORY FOR ADAPTABLE MANUFACTURING OF ICS, IEEE transactions on semiconductor manufacturing, 7(2), 1994, pp. 159-175
IN-SITU ACOUSTIC TEMPERATURE TOMOGRAPHY OF SEMICONDUCTOR WAFERS
Authors: DEGERTEKIN FL PEI J KHURIYAKUB BT SARASWAT KC
Citation: Fl. Degertekin et al., IN-SITU ACOUSTIC TEMPERATURE TOMOGRAPHY OF SEMICONDUCTOR WAFERS, Applied physics letters, 64(11), 1994, pp. 1338-1340
Risultati: 1-11 |