Authors:
HARTNER W
SCHINDLER G
WEINRICH V
NAGEL N
ENGELHARDT M
JOSHI W
SOLAYAPPAN N
DERBENWICK G
DEHM C
MAZURE C
Citation: W. Hartner et al., ROLE OF RECOVERY ANNEALS FOR CHEMICAL SOLUTION DEPOSITION (CSD) BASEDSRBI2TA2O9 (SBT) THIN-FILMS, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 543-553
Authors:
JOSHI V
SOLAYAPPAN N
HARTNER W
SCHINDLER G
DEHM C
MAZURE C
DERBENWICK G
Citation: V. Joshi et al., THE ROLE OF RAPID THERMAL-PROCESSING IN CRYSTALLIZATION OF SBT THIN-FILMS, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 595-601
Authors:
GROSSMANN M
LOHSE O
BOLTEN D
WASER R
HARTNER W
SCHINDLER G
DEHM C
NAGEL N
JOSHI V
SOLAYAPPAN N
DERBENWICK G
Citation: M. Grossmann et al., IMPRINT IN FERROELECTRIC SRBI2TA2O9 CAPACITORS FOR NONVOLATILE MEMORYAPPLICATIONS, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 615-627
Authors:
HINTERMAIER F
HENDRIX B
DESROCHERS D
ROEDER J
BAUM T
VANBUSKIRK P
BOLTEN D
GROSSMANN M
LOHSE O
SCHUMACHER M
WASER R
CERVA H
DEHM C
FRITSCH E
HONLEIN W
MAZURE C
NAGEL N
THWAITE P
WENDT H
Citation: F. Hintermaier et al., PROPERTIES OF SRBI2TA2O9 THIN-FILMS GROWN BY MOCVD FOR HIGH-DENSITY FERAM APPLICATIONS, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 367-379
Citation: I. Kasko et al., ION-BEAM MIXING OF CO-SI AND CO-SIO2 - A COMPARISON BETWEEN MONTE-CARLO SIMULATIONS AND EXPERIMENTS, Radiation effects and defects in solids, 130, 1994, pp. 345-352
Citation: C. Dehm et al., ION-BEAM-INDUCED COSI2 LAYERS - FORMATION AND CONTACT PROPERTIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84(2), 1994, pp. 148-152
Citation: C. Dehm et al., INFLUENCE OF IMPURITIES ON ION-BEAM-INDUCED TISI2 FORMATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 759-763
Citation: I. Kasko et al., EFFECT OF ION-BEAM MIXING TEMPERATURE ON COBALT SILICIDE FORMATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 786-789