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Authors:
SADASHIVAN S
AGGARWAL S
SONG TK
RAMESH R
EVANS JT
TUTTLE BA
WARREN WL
DIMOS D
Citation: S. Sadashivan et al., EVALUATION OF IMPRINT IN FULLY INTEGRATED (LA,SR)COO3 PB(NB,ZR,TI)O-3/(LA,SR)COO3 FERROELECTRIC CAPACITORS/, Journal of applied physics, 83(4), 1998, pp. 2165-2171
Citation: D. Dimos et Ba. Tuttle, THE 9TH INTERNATIONAL-SYMPOSIUM ON INTEGRATED FERROELECTRICS - SANTA-FE, MEXICO, USA - MARCH 3-5, 1997, Integrated ferroelectrics, 18(1-4), 1997, pp. 17-17
Authors:
SCHWARTZ RW
REICHERT TL
CLEM PG
DIMOS D
LIU D
Citation: Rw. Schwartz et al., A COMPARISON OF DIOL AND METHANOL-BASED CHEMICAL SOLUTION DEPOSITION ROUTES FOR PZT THIN-FILM FABRICATION, Integrated ferroelectrics, 18(1-4), 1997, pp. 275-286
Citation: D. Dimos et Ba. Tuttle, PROCEEDINGS OF THE 9TH INTERNATIONAL-SYMPOSIUM ON INTEGRATED FERROELECTRICS - SANTA-FE, NEW-MEXICO, USA - MARCH 3-5, 1997 .1. GUEST EDITORIAL, Integrated ferroelectrics, 17(1-4), 1997, pp. 11-11
Authors:
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DIMOS D
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Citation: Wl. Warren et al., RELATIONSHIPS AMONG FERROELECTRIC FATIGUE, ELECTRONIC CHARGE TRAPPING, DEFECT-DIPOLES, AND OXYGEN VACANCIES IN PEROVSKITE OXIDES, Integrated ferroelectrics, 16(1-4), 1997, pp. 77-86
Citation: Hn. Alshareef et al., A MODEL FOR OPTICAL AND ELECTRICAL-POLARIZATION FATIGUE IN SRBI2TA2O9AND PB(ZR,TI)O-3, Integrated ferroelectrics, 15(1-4), 1997, pp. 53-67
Authors:
BOYLE TJ
ALAM TM
DIMOS D
MOORE GJ
BUCHHEIT CD
ALSHAREEF HN
MECHENBIER ER
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ZILLER JW
Citation: Tj. Boyle et al., NIOBIUM(V) ALKOXIDES - SYNTHESIS, STRUCTURE, AND CHARACTERIZATION OF [NB(MU-OCH2CH3)(OCH2C(CH3)(3))(4)](2), 2O)(CH2-MU-O)(C(O)(2))]NB-2(MU-O)(OCH2CH3)(5))(2), AND ([H3CC(CH2O)(2)(CH2-MU-O)]NB(OCH2CH3)(2))(2) FOR PRODUCTION OF MIXED-METAL OXIDE THIN-FILMS, Chemistry of materials, 9(12), 1997, pp. 3187-3198
Authors:
BOYLE TJ
DIMOS D
SCHWARTZ RW
ALAM TM
SINCLAIR MB
BUCHHEIT CD
Citation: Tj. Boyle et al., AGING CHARACTERISTICS OF A HYBRID SOL-GEL PB(ZR,TI)O-3 PRECURSOR SOLUTION, Journal of materials research, 12(4), 1997, pp. 1022-1030
Citation: Bg. Potter et al., WAVE-GUIDE REFRACTOMETRY AS A PROBE OF THIN-FILM OPTICAL UNIFORMITY, Journal of materials research, 12(2), 1997, pp. 546-551
Citation: Hn. Alshareef et D. Dimos, LEAKAGE AND RELIABILITY CHARACTERISTICS OF LEAD-ZIRCONATE-TITANATE THIN-FILM CAPACITORS, Journal of the American Ceramic Society, 80(12), 1997, pp. 3127-3132
Citation: Mj. Lefevre et al., MICROSTRUCTURAL DEVELOPMENT IN SOL-GEL DERIVED LEAD-ZIRCONATE-TITANATE THIN-FILMS - THE ROLE OF PRECURSOR STOICHIOMETRY AND PROCESSING ENVIRONMENT, Journal of materials research, 11(8), 1996, pp. 2076-2084
Authors:
VAIDYA R
SIMONSON RJ
CESARANO J
DIMOS D
LOPEZ GP
Citation: R. Vaidya et al., FORMATION AND STABILITY OF SELF-ASSEMBLED MONOLAYERS ON THIN-FILMS OFLEAD-ZIRCONATE-TITANATE (PZT), Langmuir, 12(11), 1996, pp. 2830-2836
Authors:
DIMOS D
DOUBOVIK E
DJALALOV R
FRIDKIN V
BATIROV T
Citation: D. Dimos et al., THE PHOTOINDUCED HYSTERESIS PHENOMENA IN FERROELECTRIC PZT FILMS, Ferroelectrics. Letters section, 21(5-6), 1996, pp. 167-174
Citation: D. Dimos et al., PHOTOINDUCED CHANGES IN THE FATIGUE BEHAVIOR OF SRBI2TA2O9 AND PB(ZR,TI)O-3 THIN-FILMS, Journal of applied physics, 80(3), 1996, pp. 1682-1687
Authors:
ALSHAREEF HN
TUTTLE BA
WARREN WL
HEADLEY TJ
DIMOS D
VOIGT JA
NASBY RD
Citation: Hn. Alshareef et al., EFFECT OF B-SITE CATION STOICHIOMETRY ON ELECTRICAL FATIGUE OF RUO2 PB(ZRXTI1-X)O-3/RUO2 CAPACITORS/, Journal of applied physics, 79(2), 1996, pp. 1013-1016