Authors:
WANG Y
CHEN LY
XU B
ZHENG WM
ZHANG RJ
QIAN DL
ZHOU SM
ZHENG YX
DAI N
YANG YM
DING KB
ZHANG XM
Citation: Y. Wang et al., THE MEDIUM-RELATED OPTICAL-CONSTANTS OF NOBLE-METALS OBSERVED BY ELLIPSOMETRIC STUDY, Thin solid films, 313, 1998, pp. 232-236
Citation: Kb. Ding et al., IMPROVED FORMULAS FOR DETERMINING BULK GENERATION LIFETIME AND SURFACE GENERATION VELOCITY, Solid-state electronics, 42(1), 1998, pp. 181-184
Citation: Xm. Zhang et al., PROCESSING AND CHARACTERIZATION OF PECVD SILICON-NITRIDE FILMS, Advanced materials for optics and electronics, 6(3), 1996, pp. 147-150
Citation: Xm. Zhang et Kb. Ding, THE DEPENDENCE OF THE INVERSION SHEET RESISTANCE AND INDUCED JUNCTIONDEPTH UPON THE OPERATING-CONDITIONS FOR SILICON INVERSION LAYER SOLAR-CELLS, Journal of physics. D, Applied physics, 29(2), 1996, pp. 483-486
Citation: Kb. Ding et Xm. Zhang, FIELD-ENHANCED CARRIER-GENERATION EFFECT OF DEEP-LEVEL CENTERS IN SEMICONDUCTORS, Applied physics. A, Solids and surfaces, 57(6), 1993, pp. 529-532