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Results: 1-18 |
Results: 18
QUANTITATION OF MAJOR ELEMENTS WITH SECONDARY-ION MASS-SPECTROMETRY BY USING M-2(-MOLECULAR IONS())
Authors: VLEKKEN J WU TD DOLIESLAEGER M KNUYT G VANDERVORST W DESCHEPPER L
Citation: J. Vlekken et al., QUANTITATION OF MAJOR ELEMENTS WITH SECONDARY-ION MASS-SPECTROMETRY BY USING M-2(-MOLECULAR IONS()), Journal of the American Society for Mass Spectrometry, 9(6), 1998, pp. 638-642
STUDY OF DIFFERENT CHEMICAL METHODS TO PREPARE CERAMIC HIGH-TEMPERATURE SUPERCONDUCTORS
Authors: VANBAEL MK KNAEPEN E KAREIVA A SCHILDERMANS I NOUWEN R DHAEN J DOLIESLAEGER M QUAEYHAEGENS C FRANCO D YPERMAN J MULLENS J VANPOUCKE LC
Citation: Mk. Vanbael et al., STUDY OF DIFFERENT CHEMICAL METHODS TO PREPARE CERAMIC HIGH-TEMPERATURE SUPERCONDUCTORS, Superconductor science and technology, 11(1), 1998, pp. 82-87
EFFECT OF OXYGEN ON THE ELECTRICAL CHARACTERISTICS OF PPV-LEDS
Authors: MANCA J BIJNENS W KIEBOOMS R DHAEN J DOLIESLAEGER M WU TD DECEUNINCK W DESCHEPPER L VANDERZANDE D GELAN J STALS L
Citation: J. Manca et al., EFFECT OF OXYGEN ON THE ELECTRICAL CHARACTERISTICS OF PPV-LEDS, Optical materials, 9(1-4), 1998, pp. 134-137
ENHANCEMENT OF T-C BY SUBSTITUTING STRONTIUM FOR BARIUM IN THE YBA2CU4O8 SUPERCONDUCTOR PREPARED BY A SOL-GEL METHOD
Authors: VANBAEL MK KAREIVA A VANHOYLAND G DHAEN J DOLIESLAEGER M FRANCO D QUAEYHAEGENS C YPERMAN J MULLENS J VANPOUCKE LC
Citation: Mk. Vanbael et al., ENHANCEMENT OF T-C BY SUBSTITUTING STRONTIUM FOR BARIUM IN THE YBA2CU4O8 SUPERCONDUCTOR PREPARED BY A SOL-GEL METHOD, Physica. C, Superconductivity, 307(3-4), 1998, pp. 209-220
ELECTRICAL-FIELD INDUCED AGING OF POLYMER LIGHT-EMITTING-DIODES IN ANOXYGEN-RICH ATMOSPHERE STUDIED BY EMISSION MICROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROSCOPY
Authors: BIJNENS W DEWOLF I MANCA J DHAEN J WU TD DOLIESLAEGER M BEYNE E KIEBOOMS R VANDERZANDE D GELAN J DECEUNINCK W DESCHEPPER L STALS LM
Citation: W. Bijnens et al., ELECTRICAL-FIELD INDUCED AGING OF POLYMER LIGHT-EMITTING-DIODES IN ANOXYGEN-RICH ATMOSPHERE STUDIED BY EMISSION MICROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROSCOPY, Synthetic metals, 96(2), 1998, pp. 87-96
PREPARATION AND CHARACTERIZATION OF COPRECIPITATES AND MECHANICAL MIXTURES OF CALCIUM-STRONTIUM OXALATES USING XRD, SEM-EDX AND TG
Authors: KNAEPEN E VANBAEL MK SCHILDERMANS I NOUWEN R DHAEN J DOLIESLAEGER M QUAEYHAEGENS C FRANCO D YPERMAN J MULLENS J VANPOUCKE LC
Citation: E. Knaepen et al., PREPARATION AND CHARACTERIZATION OF COPRECIPITATES AND MECHANICAL MIXTURES OF CALCIUM-STRONTIUM OXALATES USING XRD, SEM-EDX AND TG, Thermochimica acta, 318(1-2), 1998, pp. 143-153
STUDY OF CU DIFFUSION IN AN AL-1 WT-PERCENT-SI-0.5 WT-PERCENT-CU BONDPAD WITH AN AL-1 WT-PERCENT-SI BOND WIRE ATTACHED USING SCANNING ELECTRON-MICROSCOPY
Authors: COSEMANS P DHAEN J WITVROUW A PROOST J DOLIESLAEGER M DECEUNINCK W MAEX K DESCHEPPER L
Citation: P. Cosemans et al., STUDY OF CU DIFFUSION IN AN AL-1 WT-PERCENT-SI-0.5 WT-PERCENT-CU BONDPAD WITH AN AL-1 WT-PERCENT-SI BOND WIRE ATTACHED USING SCANNING ELECTRON-MICROSCOPY, Microelectronics and reliability, 38(3), 1998, pp. 309-315
INVESTIGATION OF N-DOPING IN CVD DIAMOND USING GAP STATES SPECTROSCOPY
Authors: NESLADEK M MEYKENS K STALS LM QUAEYHAEGENS C DOLIESLAEGER M WU TD VANECEK M ROSA J
Citation: M. Nesladek et al., INVESTIGATION OF N-DOPING IN CVD DIAMOND USING GAP STATES SPECTROSCOPY, DIAMOND AND RELATED MATERIALS, 5(9), 1996, pp. 1006-1011
IMAGING OF THE AGING ON ORGANIC ELECTROLUMINESCENT DIODES, UNDER DIFFERENT ATMOSPHERES BY IMPEDANCE SPECTROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SIMS DEPTH PROFILING ANALYSIS
Authors: BIJNENS W MANCA J WU TD DOLIESLAEGER M VANDERZANDE D GELAN J DECEUNINCK W DESCHEPPER L STALS LM
Citation: W. Bijnens et al., IMAGING OF THE AGING ON ORGANIC ELECTROLUMINESCENT DIODES, UNDER DIFFERENT ATMOSPHERES BY IMPEDANCE SPECTROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SIMS DEPTH PROFILING ANALYSIS, Synthetic metals, 83(3), 1996, pp. 261-265
MONTE-CARLO SIMULATION OF THE FORMATION OF MCS(-IONS() MOLECULAR)
Authors: VLEKKEN J WU TD DOLIESLAEGER M KNUYT G DESCHEPPER L STALS LM
Citation: J. Vlekken et al., MONTE-CARLO SIMULATION OF THE FORMATION OF MCS(-IONS() MOLECULAR), International journal of mass spectrometry and ion processes, 156(1-2), 1996, pp. 61-66
QUANTITATIVE-ANALYSIS OF THE COMPOUND LAYER OF PLASMA-NITRIDED PURE IRON
Authors: DHAEN J DOLIESLAEGER M DESCHEPPER L STALS LM
Citation: J. Dhaen et al., QUANTITATIVE-ANALYSIS OF THE COMPOUND LAYER OF PLASMA-NITRIDED PURE IRON, Mikrochimica acta, 1996, pp. 271-277
STUDY OF THE MICROSTRUCTURE OF IC INTERCONNECT METALLIZATIONS USING ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROMETRY
Authors: COSEMANS P DOLIESLAEGER M DECEUNINCK W DESCHEPPER L STALS L
Citation: P. Cosemans et al., STUDY OF THE MICROSTRUCTURE OF IC INTERCONNECT METALLIZATIONS USING ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROMETRY, Microelectronics and reliability, 36(11-12), 1996, pp. 1699-1702
IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS
Authors: MANCA J DESCHEPPER L DECEUNINCK W DOLIESLAEGER M STALS LM
Citation: J. Manca et al., IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS, Quality and reliability engineering international, 11(4), 1995, pp. 307-311
LATERAL AND VERTICAL DOPANT PROFILING IN SEMICONDUCTORS BY ATOMIC-FORCE MICROSCOPY USING CONDUCTING TIPS
Authors: DEWOLF P SNAUWAERT J HELLEMANS L CLARYSSE T VANDERVORST W DOLIESLAEGER M QUAEYHAEGENS D
Citation: P. Dewolf et al., LATERAL AND VERTICAL DOPANT PROFILING IN SEMICONDUCTORS BY ATOMIC-FORCE MICROSCOPY USING CONDUCTING TIPS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1699-1704
INFLUENCE OF THE PRESENCE OF WHITE LAYERS FORMED DURING GRINDING AND WIRE-ELECTRO-DISCHARGE MACHINING ON PVD TIN COATING ADHESION
Authors: PALMERS J VANSTAPPEN M DHAEN J DOLIESLAEGER M STALS LM UHLIG G FOLLER M HABERLING E
Citation: J. Palmers et al., INFLUENCE OF THE PRESENCE OF WHITE LAYERS FORMED DURING GRINDING AND WIRE-ELECTRO-DISCHARGE MACHINING ON PVD TIN COATING ADHESION, Surface & coatings technology, 74-5(1-3), 1995, pp. 162-167
STRUCTURE-ANALYSIS OF PLASMA-NITRIDED PURE IRON
Authors: DHAEN J QUAEYHAEGENS C KNUYT G DOLIESLAEGER M STALS LM
Citation: J. Dhaen et al., STRUCTURE-ANALYSIS OF PLASMA-NITRIDED PURE IRON, Surface & coatings technology, 74-5(1-3), 1995, pp. 405-411
INVESTIGATION OF THE CVD DIAMOND INTERMEDIATE LAYER STEEL INTERFACE
Authors: NESLADEK M ASINARI C SPINNEWYN J LEBOUT R LORENT R DOLIESLAEGER M
Citation: M. Nesladek et al., INVESTIGATION OF THE CVD DIAMOND INTERMEDIATE LAYER STEEL INTERFACE, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 912-916
THE PERFORMANCE OF (TI,AL)N-COATED FLOWDRILLS
Authors: KERKHOFS M VANSTAPPEN M DOLIESLAEGER M QUAEYHAEGENS C STALS LM
Citation: M. Kerkhofs et al., THE PERFORMANCE OF (TI,AL)N-COATED FLOWDRILLS, Surface & coatings technology, 68, 1994, pp. 741-746
Risultati: 1-18 |