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Results:
1-8
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Results: 8
Authors:
AURIEL G
DUBUC JP
SAGNES B
OUALID J
VUILLAUME D
Citation: G. Auriel et al., NEW INSIGHTS ON THE CHARGING AND DISCHARGING OF ELECTRON TRAPS CREATED BY HOMOGENEOUS ELECTRON INJECTION IN GATE OXIDE, Microelectronic engineering, 36(1-4), 1997, pp. 309-312
Authors:
BOLINDER MA
ANGERS DA
DUBUC JP
Citation: Ma. Bolinder et al., ESTIMATING SHOOT TO ROOT RATIOS AND ANNUAL CARBON INPUTS IN SOILS FORCEREAL CROPS, Agriculture, ecosystems & environment, 63(1), 1997, pp. 61-66
Authors:
MONGRAIN D
COUTURE L
DUBUC JP
COMEAU A
Citation: D. Mongrain et al., OCCURRENCE OF THE ORANGE WHEAT BLOSSOM MIDGE [DIPTERA, CECIDOMYIIDAE]IN QUEBEC AND ITS INCIDENCE ON WHEAT-GRAIN MICROFLORA, Phytoprotection, 78(1), 1997, pp. 17-22
Authors:
AURIEL G
DUBUC JP
SAGNES B
OUALID J
Citation: G. Auriel et al., METHODS TO DETERMINE ELECTRON TRAPS CREATED IN GATE OXIDES BY FOWLER-NORDHEIM INJECTION, Journal of non-crystalline solids, 220(2-3), 1997, pp. 157-163
Authors:
SIMOEN E
DUBUC JP
VANHELLEMONT J
CLAEYS C
Citation: E. Simoen et al., IMPACT OF THE STARTING INTERSTITIAL OXYGEN CONCENTRATION ON THE ELECTRICAL CHARACTERISTICS OF ELECTRON-IRRADIATED SI JUNCTION DIODES, Materials science & engineering. B, Solid-state materials for advanced technology, 36(1-3), 1996, pp. 179-182
Authors:
SIMOEN E
VANHELLEMONT J
DUBUC JP
CLAEYS C
OHYAMA H
JOHLANDER B
Citation: E. Simoen et al., HIGH-ENERGY PARTICLE IRRADIATION EFFECTS ON THE LOW-FREQUENCY NOISE OF CZOCHRALSKI SILICON JUNCTION DIODES, Applied physics letters, 68(6), 1996, pp. 788-790
Authors:
DUBUC JP
SIMOEN E
VASINA P
CLAEYS C
Citation: Jp. Dubuc et al., LOW-FREQUENCY NOISE BEHAVIOR OF HIGH-ENERGY ELECTRON-IRRADIATED SI N(+)P JUNCTION DIODES, Electronics Letters, 31(12), 1995, pp. 1016-1018
Authors:
DEMURCIA M
RICHARD E
GASQUET D
DUBUC JP
VANBREMEERSCH J
ZIMMERMANN J
Citation: M. Demurcia et al., HIGH-FREQUENCY NOISE AND DIFFUSION-COEFFICIENT OF HOT-ELECTRONS IN BULK AL0.25GA0.75AS, Solid-state electronics, 37(8), 1994, pp. 1477-1483
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