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Authors: LU YL WEI T DUEWER F LU YQ MING NB SCHULTZ PG XIANG XD

Citation: Yl. Lu et al., NONDESTRUCTIVE IMAGING OF DIELECTRIC-CONSTANT PROFILES AND FERROELECTRIC DOMAINS WITH A SCANNING-TIP MICROWAVE NEAR-FIELD MICROSCOPE, Science, 276(5321), 1997, pp. 2004-2006

Authors: TAKEUCHI I WEI T DUEWER F YOO YK XIANG XD TALYANSKY V PAI SP CHEN GJ VENKATESAN T

Citation: I. Takeuchi et al., LOW-TEMPERATURE SCANNING-TIP MICROWAVE NEAR-FIELD MICROSCOPY OF YBA2CU3O7-X FILMS, Applied physics letters, 71(14), 1997, pp. 2026-2028

Authors: GAO C WEI T DUEWER F LU YL XIANG XD

Citation: C. Gao et al., HIGH-SPATIAL-RESOLUTION QUANTITATIVE MICROWAVE IMPEDANCE MICROSCOPY BY A SCANNING TIP MICROWAVE NEAR-FIELD MICROSCOPE, Applied physics letters, 71(13), 1997, pp. 1872-1874