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Results:
1-10
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Results: 10
Authors:
DUPARRE A
KAISER N
Citation: A. Duparre et N. Kaiser, AFM HELPS ENGINEER LOW-SCATTER THIN-FILMS, Laser focus, 34(4), 1998, pp. 147
Authors:
JAKOBS S
DUPARRE A
TRUCKENBRODT H
Citation: S. Jakobs et al., AFM AND LIGHT-SCATTERING MEASUREMENTS OF OPTICAL THIN-FILMS FOR APPLICATIONS IN THE UV SPECTRAL REGION, International journal of machine tools & manufacture, 38(5-6), 1998, pp. 733-739
Authors:
JAKOBS S
DUPARRE A
TRUCKENBRODT H
Citation: S. Jakobs et al., INTERFACIAL ROUGHNESS AND RELATED SCATTER IN ULTRAVIOLET OPTICAL COATINGS - EXPERIMENTAL APPROACH, Applied optics, 37(7), 1998, pp. 1180-1193
Authors:
JAKOBS S
SCHULZ U
DUPARRE A
KAISER N
Citation: S. Jakobs et al., CHARACTERIZATION OF SIO2 PROTECTIVE COATINGS ON POLYCARBONATE, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 242-244
Authors:
RUPPE C
DUPARRE A
Citation: C. Ruppe et A. Duparre, ROUGHNESS ANALYSIS OF OPTICAL FILMS AND SUBSTRATES BY ATOMIC-FORCE MICROSCOPY, Thin solid films, 288(1-2), 1996, pp. 8-13
Authors:
DUPARRE A
JAKOBS S
Citation: A. Duparre et S. Jakobs, COMBINATION OF SURFACE CHARACTERIZATION TECHNIQUES FOR INVESTIGATING OPTICAL THIN-FILM COMPONENTS, Applied optics, 35(25), 1996, pp. 5052-5058
Authors:
DUPARRE A
RUPPE C
PISCHOW KA
ADAMIK M
BARNA PB
Citation: A. Duparre et al., ATOMIC-FORCE MICROSCOPY ON CROSS-SECTIONS OF OPTICAL COATINGS - A NEWMETHOD, Thin solid films, 261(1-2), 1995, pp. 70-75
Authors:
ROTHE H
DUPARRE A
JACOBS S
Citation: H. Rothe et al., GENERIC DETRENDING OF SURFACE PROFILES, Optical engineering, 33(9), 1994, pp. 3023-3030
Authors:
REICHLING M
WELSCH E
DUPARRE A
MATTHIAS E
Citation: M. Reichling et al., PHOTOTHERMAL ABSORPTION MICROSCOPY OF DEFECTS IN ZRO2 AND MGF2 SINGLE-LAYER FILMS, Optical engineering, 33(4), 1994, pp. 1334-1342
Authors:
DUPARRE A
KASSAM S
Citation: A. Duparre et S. Kassam, RELATION BETWEEN LIGHT-SCATTERING AND THE MICROSTRUCTURE OF OPTICAL THIN-FILMS, Applied optics, 32(28), 1993, pp. 5475-5480
Risultati:
1-10
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