Authors:
Vandamme, LKJ
Perichaud, MG
Noguera, E
Danto, Y
Behner, U
Citation: Lkj. Vandamme et al., 1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds, IEEE T COMP, 22(3), 1999, pp. 446-454
Authors:
Benbrik, J
Rolland, G
Meunier, D
Benteo, B
Labat, N
Maneux, C
Danto, Y
Citation: J. Benbrik et al., 2D physical simulation of degradation on transistors induced by FIB exposure of dielectric passivation, MICROEL REL, 39(6-7), 1999, pp. 1027-1031
Authors:
Saysset-Malbert, N
Lambert, B
Maneux, C
Labat, N
Touboul, A
Danto, Y
Vandamme, LKJ
Huguet, P
Auxemery, P
Garat, F
Citation: N. Saysset-malbert et al., Effects of RF life-test on LF electrical parameters of GaAs power MESFETs, MICROEL REL, 39(6-7), 1999, pp. 1061-1066
Authors:
Vandamme, LKJ
Perichaud, MG
Noguera, E
Danto, Y
Behner, U
Citation: Lkj. Vandamme et al., 1/f Noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment, MICROEL REL, 39(6-7), 1999, pp. 1089-1094
Authors:
Bechou, L
Angrisiani, L
Ousten, Y
Dallet, D
Levi, H
Daponte, P
Danto, Y
Citation: L. Bechou et al., Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy, MICROEL REL, 39(6-7), 1999, pp. 1095-1101