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Results: 1-11 |
Results: 11
Dynamics of capillary spreading along hydrophilic microstripes - art. no. 031603
Authors: Darhuber, AA Troian, SM Reisner, WW
Citation: Aa. Darhuber et al., Dynamics of capillary spreading along hydrophilic microstripes - art. no. 031603, PHYS REV E, 6403(3), 2001, pp. 1603
Physical mechanisms governing pattern fidelity in microscale offset printing
Authors: Darhuber, AA Troian, SM Wagner, S
Citation: Aa. Darhuber et al., Physical mechanisms governing pattern fidelity in microscale offset printing, J APPL PHYS, 90(7), 2001, pp. 3602-3609
Selective dip-coating of chemically micropatterned surfaces
Authors: Darhuber, AA Troian, SM Davis, JM Miller, SM Wagner, S
Citation: Aa. Darhuber et al., Selective dip-coating of chemically micropatterned surfaces, J APPL PHYS, 88(9), 2000, pp. 5119-5126
Morphology of liquid microstructures on chemically patterned surfaces
Authors: Darhuber, AA Troian, SM Miller, SM Wagner, S
Citation: Aa. Darhuber et al., Morphology of liquid microstructures on chemically patterned surfaces, J APPL PHYS, 87(11), 2000, pp. 7768-7775
Structural characterization of self-organized Ge islands
Authors: Darhuber, AA Bauer, G Schittenhelm, P Abstreiter, G
Citation: Aa. Darhuber et al., Structural characterization of self-organized Ge islands, ELECTR MAT, 6, 2000, pp. 233-258
X-ray diffraction from quantum wires and quantum dots
Authors: Zhuang, Y Stangl, J Darhuber, AA Bauer, G Mikulik, P Holy, V Darowski, N Pietsch, U
Citation: Y. Zhuang et al., X-ray diffraction from quantum wires and quantum dots, J MAT S-M E, 10(3), 1999, pp. 215-221
X-ray reflection from self-organized interfaces in an SiGe/Si multilayer
Authors: Grim, J Holy, V Kubena, J Darhuber, AA Zerlauth, S Bauer, G
Citation: J. Grim et al., X-ray reflection from self-organized interfaces in an SiGe/Si multilayer, SEMIC SCI T, 14(1), 1999, pp. 32-40
Self-assembled Germanium-dot multilayers embedded in silicon
Authors: Bauer, G Darhuber, AA Holy, V
Citation: G. Bauer et al., Self-assembled Germanium-dot multilayers embedded in silicon, CRYST RES T, 34(2), 1999, pp. 197-209
High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si
Authors: Stangl, J Holy, V Darhuber, AA Mikulik, P Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: J. Stangl et al., High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si, J PHYS D, 32(10A), 1999, pp. A71-A74
Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers
Authors: Grim, J Holy, V Kubena, J Stangl, J Darhuber, AA Zerlauth, S Schaffler, F Bauer, G
Citation: J. Grim et al., Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers, J PHYS D, 32(10A), 1999, pp. A216-A219
Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction
Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229
Risultati: 1-11 |