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Citation: Jh. Werner et al., From polycrystalline to single crystalline silicon on glass, THIN SOL FI, 383(1-2), 2001, pp. 95-100

Authors: Nerding, M Christiansen, S Krinke, J Dassow, R Kohler, JR Werner, JH Strunk, HP

Citation: M. Nerding et al., Grain populations in laser-crystallised silicon thin films on glass substrates, THIN SOL FI, 383(1-2), 2001, pp. 110-112

Authors: Helen, Y Dassow, R Nerding, M Mourgues, K Raoult, F Kohler, JR Mohammed-Brahim, T Rogel, R Bonnaud, O Werner, JH Strunk, HP

Citation: Y. Helen et al., High mobility thin film transistors by Nd : YVO4-laser crystallization, THIN SOL FI, 383(1-2), 2001, pp. 143-146

Authors: Toutah, H Tala-Ighil, B Llibre, JF Rahal, A Mourgues, K Helen, Y Brahim, TM Dassow, R Kohler, JR

Citation: H. Toutah et al., Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material, THIN SOL FI, 383(1-2), 2001, pp. 299-302

Authors: Dassow, R Kohler, JR Helen, Y Mourgues, K Bonnaud, O Mohammed-Brahim, T Werner, JH

Citation: R. Dassow et al., Laser crystallization of silicon for high-performance thin-film transistors, SEMIC SCI T, 15(10), 2000, pp. L31-L34

Authors: Kohler, JR Dassow, R Bergmann, RB Krinke, J Strunk, HP Werner, JH

Citation: Jr. Kohler et al., Large-grained polycrystalline silicon on glass by copper vapor laser annealing, THIN SOL FI, 337(1-2), 1999, pp. 129-132