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Results:
1-7
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Results: 7
Authors:
Osofsky, MS
Soulen, RJ
Nadgorny, BE
Trotter, G
Broussard, PR
DeSisto, WJ
Citation: Ms. Osofsky et al., Measurement of the transport spin-polarization of oxides using point contact Andreev reflection (PCAR), MAT SCI E B, 84(1-2), 2001, pp. 49-52
Authors:
Bermudez, VM
DeSisto, WJ
Citation: Vm. Bermudez et Wj. Desisto, Study of chromium oxide film growth by chemical vapor deposition using infrared reflection absorption spectroscopy, J VAC SCI A, 19(2), 2001, pp. 576-583
Authors:
Cukauskas, EJ
Pond, JM
Dobisz, EA
DeSisto, WJ
Citation: Ej. Cukauskas et al., Critical current characteristics of YBa2Cu3O7 thin films on (110) SrTiO3, IEEE APPL S, 10(3), 2000, pp. 1649-1656
Authors:
Grun, J
Fischer, RP
Peckerar, M
Felix, CL
Covington, BC
DeSisto, WJ
Donnelly, DW
Ting, A
Manka, CK
Citation: J. Grun et al., Athermal annealing of phosphorus-ion-implanted silicon, APPL PHYS L, 77(13), 2000, pp. 1997-1999
Authors:
DeSisto, WJ
Broussard, PR
Ambrose, TF
Nadgorny, BE
Osofsky, MS
Citation: Wj. Desisto et al., Highly spin-polarized chromium dioxide thin films prepared by chemical vapor deposition from chromyl chloride, APPL PHYS L, 76(25), 2000, pp. 3789-3791
Authors:
DeSisto, WJ
Cukauskas, EJ
Rappoli, BJ
Culbertson, JC
Claassen, JH
Citation: Wj. Desisto et al., Metal-organic chemical vapor deposition of La2CuO4+x thin films with gas phase composition control, CHEM VAPOR, 5(5), 1999, pp. 233-236
Authors:
Cukauskas, EJ
Kirchoefer, SW
DeSisto, WJ
Pond, JM
Citation: Ej. Cukauskas et al., Ba(1-x)SrxTiO3 thin films by off-axis cosputtering BaTiO3 and SrTiO3, APPL PHYS L, 74(26), 1999, pp. 4034-4036
Risultati:
1-7
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