Authors:
Badenes, G
Rooyackers, R
Augendre, E
Vandamme, E
Perello, C
Heylen, N
Grillaert, J
Deferm, L
Citation: G. Badenes et al., A new dummy-free shallow trench isolation concept for mixed-signal applications, J ELCHEM SO, 147(10), 2000, pp. 3827-3832
Authors:
Gramenova, E
Jansen, P
Simoen, E
Vanhellemont, J
Dupas, L
Deferm, L
Citation: E. Gramenova et al., Impact of processing parameters on leakage current and defect behavior of n(+)p silicon junction diodes, J ELCHEM SO, 146(1), 1999, pp. 359-363