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Results: 12
Influence of low-temperature buffer layers on the optical waveguiding properties of AlxGa1-xN alloys
Authors:
Dogheche, E
Ruterana, P
Omnes, F
Citation: E. Dogheche et al., Influence of low-temperature buffer layers on the optical waveguiding properties of AlxGa1-xN alloys, J APPL PHYS, 90(9), 2001, pp. 4411-4414
Authors:
Djemia, P
Dugautier, C
Chauveau, T
Dogheche, E
De Barros, MI
Vandenbulcke, L
Citation: P. Djemia et al., Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering, J APPL PHYS, 90(8), 2001, pp. 3771-3779
Authors:
Lansiaux, X
Dogheche, E
Remiens, D
Guilloux-viry, M
Perrin, A
Ruterana, P
Citation: X. Lansiaux et al., LiNbO3 thick films grown on sapphire by using a multistep sputtering process, J APPL PHYS, 90(10), 2001, pp. 5274-5277
Authors:
Dogheche, E
Belgacem, B
Remiens, D
Ruterana, P
Omnes, F
Citation: E. Dogheche et al., Prism coupling as a non destructive tool for optical characterization of (Al,Ga) nitride compounds, MRS I J N S, 5, 2000, pp. NIL_641-NIL_646
Authors:
Lansiaux, X
Dogheche, E
Remiens, D
Citation: X. Lansiaux et al., Lithium niobate thick films grown by RF sputtering: Correlation between optical analysis and transmission electron microscopy observations, INTEGR FERR, 31(1-4), 2000, pp. 105-116
Authors:
Dogheche, E
Remiens, D
Citation: E. Dogheche et D. Remiens, Deposition and optical characterization of lead-based ferroelectric films or integrated optics, INTEGR FERR, 25(1-4), 1999, pp. 411-422
Authors:
Dogheche, E
Belgacem, B
Remiens, D
Ruterana, P
Omnes, F
Citation: E. Dogheche et al., Prism coupling technique for optical characterization of LP-MOVPE AlxGa1-xN thin film waveguides, PHYS ST S-A, 176(1), 1999, pp. 347-350
Authors:
Boudrioua, A
Loulergue, JC
Dogheche, E
Remiens, D
Citation: A. Boudrioua et al., Electro-optic characterization of (Pb, La)TiO3 thin films using prism-coupling technique, J APPL PHYS, 85(3), 1999, pp. 1780-1783
Authors:
Dogheche, E
Belgacem, B
Remiens, D
Ruterana, P
Omnes, F
Citation: E. Dogheche et al., Interface properties of AlxGa1-xN/AlN heterostructures from optical waveguiding information, APPL PHYS L, 75(21), 1999, pp. 3324-3326
Authors:
Dogheche, E
Remiens, D
Boudrioua, A
Loulergue, JC
Citation: E. Dogheche et al., Growth and optical characterization of aluminum nitride thin films deposited on silicon by radio-frequency sputtering, APPL PHYS L, 74(9), 1999, pp. 1209-1211
Authors:
Dogheche, E
Remiens, D
Omnes, F
Citation: E. Dogheche et al., Optical properties of low-pressure metalorganic vapor phase epitaxy AlxGa1-xN thin-film waveguides by prism coupling technique, APPL PHYS L, 74(26), 1999, pp. 3960-3962
Authors:
Dogheche, E
Jaber, B
Lansiaux, X
Remiens, D
Citation: E. Dogheche et al., PbTiO3 epitaxial thin films as optical waveguides, J PHYS IV, 8(P9), 1998, pp. 277-280
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