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Results:
1-8
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Results: 8
Authors:
Yoo, YK
Ohnishi, T
Wang, G
Duewer, F
Xiang, XD
Chu, YS
Mancini, DC
Li, YQ
O'Handley, RC
Citation: Yk. Yoo et al., Continuous mapping of structure-property relations in Fe1-xNix metallic alloys fabricated by combinatorial synthesis, INTERMETALL, 9(7), 2001, pp. 541-545
Authors:
Yoo, YK
Duewer, F
Fukumura, T
Yang, HT
Yi, D
Liu, S
Chang, HY
Hasegawa, T
Kawasaki, M
Koinuma, H
Xiang, X
Citation: Yk. Yoo et al., Strong correlation between high-temperature electronic and low-temperaturemagnetic ordering in Lal(1-x)Ca(x)MnO(3) continuous phase - art. no. 224421, PHYS REV B, 6322(22), 2001, pp. 4421
Authors:
Duewer, F
Gao, C
Xiang, XD
Citation: F. Duewer et al., Tip-sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging, REV SCI INS, 71(6), 2000, pp. 2414-2417
Authors:
Yoo, YK
Duewer, F
Yang, HT
Yi, D
Li, JW
Xiang, XD
Citation: Yk. Yoo et al., Room-temperature electronic phase transitions in the continuous phase diagrams of perovskite manganites, NATURE, 406(6797), 2000, pp. 704-708
Authors:
Li, JW
Duewer, F
Gao, C
Chang, HY
Xiang, XD
Lu, YL
Citation: Jw. Li et al., Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1-xSrxTiO3 materials chips, APPL PHYS L, 76(6), 2000, pp. 769-771
Authors:
Gao, C
Duewer, F
Xiang, XD
Citation: C. Gao et al., Quantitative microwave evanescent microscopy (vol 75, pg 3005, 1999), APPL PHYS L, 76(5), 2000, pp. 656-656
Authors:
Gao, C
Duewer, F
Xiang, XD
Citation: C. Gao et al., Quantitative microwave evanescent microscopy, APPL PHYS L, 75(19), 1999, pp. 3005-3007
Authors:
Duewer, F
Gao, C
Takeuchi, I
Xiang, XD
Citation: F. Duewer et al., Tip-sample distance feedback control in a scanning evanescent microwave microscope, APPL PHYS L, 74(18), 1999, pp. 2696-2698
Risultati:
1-8
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