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Results: 1-13 |
Results: 13
Redox activation of a polyaniline-coated cantilever: An electro-driven microdevice
Authors: Lahav, M Durkan, C Gabai, R Katz, E Willner, I Welland, ME
Citation: M. Lahav et al., Redox activation of a polyaniline-coated cantilever: An electro-driven microdevice, ANGEW CHEM, 40(21), 2001, pp. 4095
Single crystals of single-walled carbon nanotubes formed by self-assembly
Authors: Schlittler, RR Seo, JW Gimzewski, JK Durkan, C Saifullah, MSM Welland, ME
Citation: Rr. Schlittler et al., Single crystals of single-walled carbon nanotubes formed by self-assembly, SCIENCE, 292(5519), 2001, pp. 1136-1139
Temperature dependence of the ohmic conductivity and activation energy of Pb1+y(Zr0.3Ti0.7)O-3 thin films
Authors: Chu, DP McGregor, BM Migliorato, P Durkan, C Welland, ME Hasegawa, K Shimoda, T
Citation: Dp. Chu et al., Temperature dependence of the ohmic conductivity and activation energy of Pb1+y(Zr0.3Ti0.7)O-3 thin films, APPL PHYS L, 79(4), 2001, pp. 518-520
Nanometer scale electrical characterization of artificial mesostructures
Authors: Durkan, C Welland, ME
Citation: C. Durkan et Me. Welland, Nanometer scale electrical characterization of artificial mesostructures, CR R SOLID, 25(1), 2000, pp. 1-28
Analysis of failure mechanisms in electrically stressed gold nanowires
Authors: Durkan, C Welland, ME
Citation: C. Durkan et Me. Welland, Analysis of failure mechanisms in electrically stressed gold nanowires, ULTRAMICROS, 82(1-4), 2000, pp. 125-133
Investigations into local ferroelectric properties by atomic force microscopy
Authors: Durkan, C Welland, ME
Citation: C. Durkan et Me. Welland, Investigations into local ferroelectric properties by atomic force microscopy, ULTRAMICROS, 82(1-4), 2000, pp. 141-148
Size effects in the electrical resistivity of polycrystalline nanowires
Authors: Durkan, C Welland, ME
Citation: C. Durkan et Me. Welland, Size effects in the electrical resistivity of polycrystalline nanowires, PHYS REV B, 61(20), 2000, pp. 14215-14218
A high pressure, high temperature, scanning tunneling microscope for in situ studies of catalysts
Authors: Weeks, BL Durkan, C Kuramochi, H Welland, ME Rayment, T
Citation: Bl. Weeks et al., A high pressure, high temperature, scanning tunneling microscope for in situ studies of catalysts, REV SCI INS, 71(10), 2000, pp. 3777-3781
Scaling of piezoelectric properties in nanometre to micrometre scale
Authors: Durkan, C Welland, ME Chu, DP Migliorato, P
Citation: C. Durkan et al., Scaling of piezoelectric properties in nanometre to micrometre scale, ELECTR LETT, 36(18), 2000, pp. 1538-1539
High-contrast topography-free sample for near-field optical microscopy
Authors: Kalkbrenner, T Graf, M Durkan, C Mlynek, J Sandoghdar, V
Citation: T. Kalkbrenner et al., High-contrast topography-free sample for near-field optical microscopy, APPL PHYS L, 76(9), 2000, pp. 1206-1208
Investigations into local piezoelectric properties by atomic force microscopy
Authors: Durkan, C Chu, DP Migliorato, P Welland, ME
Citation: C. Durkan et al., Investigations into local piezoelectric properties by atomic force microscopy, APPL PHYS L, 76(3), 2000, pp. 366-368
Probing domains at the nanometer scale in piezoelectric thin films
Authors: Durkan, C Welland, ME Chu, DP Migliorato, P
Citation: C. Durkan et al., Probing domains at the nanometer scale in piezoelectric thin films, PHYS REV B, 60(23), 1999, pp. 16198-16204
Analysis of failure mechanisms in electrically stressed Au nanowires
Authors: Durkan, C Schneider, MA Welland, ME
Citation: C. Durkan et al., Analysis of failure mechanisms in electrically stressed Au nanowires, J APPL PHYS, 86(3), 1999, pp. 1280-1286
Risultati: 1-13 |