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Results:
1-16
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Results: 16
Authors:
EGERTON RF
WAN L
Citation: Rf. Egerton et L. Wan, LOW-COST IMAGE-CAPTURE SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE, Journal of Microscopy, 191, 1998, pp. 113-115
Authors:
RAUF IA
EGERTON RF
SAYER M
Citation: Ia. Rauf et al., TEXTURE GENERATION BY POSTDEPOSITION ANNEALING IN A TEMPERATURE-GRADIENT, Journal of applied physics, 84(4), 1998, pp. 2272-2277
Authors:
EGERTON RF
CROZIER PA
Citation: Rf. Egerton et Pa. Crozier, THE EFFECT OF LENS ABERRATIONS ON THE SPATIAL-RESOLUTION OF AN ENERGY-FILTERED TEM IMAGE, Micron, 28(2), 1997, pp. 117-124
Authors:
NARUSHIMA K
KONTANI T
EGERTON RF
URAO R
TAKEUCHI M
Citation: K. Narushima et al., INFLUENCE OF CRYSTAL-STRUCTURE ON CARRIER TRANSPORT IN TITANYLPHTHALOCYANINE THIN-FILMS, Applied surface science, 114, 1997, pp. 326-330
Authors:
RAUF IA
GADGIL PN
EGERTON RF
BOYD JD
SAYER M
Citation: Ia. Rauf et al., ENGINEERING INDIVIDUAL GRAIN-BOUNDARIES USING A ZONE-CONFINING PROCESS IN CHEMICAL-VAPOR-DEPOSITED CU FILMS, Applied physics letters, 71(16), 1997, pp. 2256-2258
Authors:
EGERTON RF
Citation: Rf. Egerton, IMPROVEMENT OF THE HYDROGENIC MODEL TO GIVE MORE ACCURATE VALUES OF K-SHELL IONIZATION CROSS-SECTIONS, Ultramicroscopy, 63(1), 1996, pp. 11-13
Authors:
BENNETT JC
EGERTON RF
Citation: Jc. Bennett et Rf. Egerton, FABRICATION OF SNXGE1-X THIN-FILMS WITH NONEQUILIBRIUM COMPOSITION, Vacuum, 47(12), 1996, pp. 1419-1422
Authors:
WAN L
EGERTON RF
Citation: L. Wan et Rf. Egerton, PREPARATION AND CHARACTERIZATION OF CARBON NITRIDE THIN-FILMS, Thin solid films, 279(1-2), 1996, pp. 34-42
Authors:
EGERTON RF
BENNETT JC
Citation: Rf. Egerton et Jc. Bennett, MICROMETALLURGY - A TECHNIQUE FOR EXAMINING THE STRUCTURE OF BINARY-ELEMENT THIN-FILMS OVER A WIDE-RANGE OF COMPOSITION, Journal of Microscopy, 183, 1996, pp. 116-123
Authors:
SCHENNER M
SCHATTSCHNEIDER P
EGERTON RF
Citation: M. Schenner et al., VALIDITY OF LORENTZIAN ANGULAR-DISTRIBUTION IN IMAGE-FORMATION WITH INELASTICALLY SCATTERED ELECTRONS, Micron, 26(5), 1995, pp. 391-394
Authors:
YANG YY
EGERTON RF
Citation: Yy. Yang et Rf. Egerton, TESTS OF 2 ALTERNATIVE METHODS FOR MEASURING SPECIMEN THICKNESS IN A TRANSMISSION ELECTRON-MICROSCOPE, Micron, 26(1), 1995, pp. 1-5
Authors:
EGERTON RF
WONG K
Citation: Rf. Egerton et K. Wong, SOME PRACTICAL CONSEQUENCES OF THE LORENTZIAN ANGULAR-DISTRIBUTION OFINELASTIC-SCATTERING, Ultramicroscopy, 59(1-4), 1995, pp. 169-180
Authors:
WONG K
EGERTON RF
Citation: K. Wong et Rf. Egerton, CORRECTION FOR THE EFFECTS OF ELASTIC-SCATTERING IN CORE-LOSS QUANTIFICATION, Journal of Microscopy, 178, 1995, pp. 198-207
Authors:
EGERTON RF
CHENG SC
Citation: Rf. Egerton et Sc. Cheng, CHARACTERIZATION OF AN ANALYTICAL ELECTRON-MICROSCOPE WITH A NIO TESTSPECIMEN, Ultramicroscopy, 55(1), 1994, pp. 43-54
Authors:
CHENG SC
EGERTON RF
Citation: Sc. Cheng et Rf. Egerton, ELEMENTAL ANALYSIS OF THICK AMORPHOUS SPECIMENS BY EELS, Micron, 24(3), 1993, pp. 251-256
Authors:
EGERTON RF
Citation: Rf. Egerton, OSCILLATOR-STRENGTH PARAMETERIZATION OF INNER-SHELL CROSS-SECTIONS, Ultramicroscopy, 50(1), 1993, pp. 13-28
Risultati:
1-16
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