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Results: 1-25/74
Authors:
ENDOH T
KURIHARA Y
Citation: T. Endoh et Y. Kurihara, INFLUENCE OF PB IMPURITY ON MELTING-POINT AND METALLOGRAPHY OF SN-5WT-PERCENT SB ALLOY, Electronics & communications in Japan. Part 2, Electronics, 81(1), 1998, pp. 1-12
Authors:
FUKUDA H
SEO H
KASAMA K
ENDOH T
NOMURA S
Citation: H. Fukuda et al., HIGHLY SENSITIVE MOSFET GAS SENSORS WITH POROUS PLATINUM GATE ELECTRODE, JPN J A P 1, 37(3B), 1998, pp. 1100-1102
Authors:
OHSHIMA KI
YOSHIDA K
SHIMODA H
WAKATSUCHI M
ENDOH T
FUKUCHI M
Citation: Ki. Ohshima et al., RELATIONSHIP BETWEEN THE UPPER OCEAN AND SEA-ICE DURING THE ANTARCTICMELTING SEASON, J GEO RES-O, 103(C4), 1998, pp. 7601-7615
Authors:
DENDA A
ENDOH T
TANG Q
TSUJIUCHI T
NAKAE D
KONISHI Y
Citation: A. Denda et al., PREVENTION BY INHIBITORS OF ARACHIDONIC-ACID CASCADE OF LIVER CARCINOGENESIS, CIRRHOSIS AND OXIDATIVE DNA-DAMAGE CAUSED BY A CHOLINE-DEFICIENT, L-AMINO ACID-DEFINED DIET IN RATS, Mutation research. Fundamental and molecular mechanisms of mutagenesis, 402(1-2), 1998, pp. 279-288
Authors:
ADACHI Y
ITOH F
YAMAMOTO H
MATSUNO K
ARIMURA Y
KUSANO M
ENDOH T
HINODA Y
OOHARA M
HOSOKAWA M
IMAI K
Citation: Y. Adachi et al., MATRIX METALLOPROTEINASE MATRILYSIN (MMP-7) PARTICIPATES IN THE PROGRESSION OF HUMAN GASTRIC AND ESOPHAGEAL CANCERS, International journal of oncology, 13(5), 1998, pp. 1031-1035
Authors:
ENDOH T
SHINMEI K
SAKURABA H
MASUOKA F
Citation: T. Endoh et al., THE ANALYSIS OF THE STACKED SURROUNDING GATE TRANSISTOR (S-SGT) DRAM FOR THE HIGH-SPEED AND LOW-VOLTAGE OPERATION, IEICE transactions on electronics, E81C(9), 1998, pp. 1491-1498
Authors:
ENDOH T
NAKAMURA K
MASUOKA F
Citation: T. Endoh et al., EVALUATION OF THE VOLTAGE DOWN-CONVERTER (VDC) WITH LOW RATIO OF CONSUMING CURRENT TO LOAD CURRENT IN DC AC OPERATION MODE/, IEICE transactions on electronics, E81C(6), 1998, pp. 968-974
Authors:
KURIHARA Y
ENDOH T
Citation: Y. Kurihara et T. Endoh, RELIABILITY OF SN-SB SOLDER FOR MOUNTING SI CHIP AND PASSIVE ELEMENTSON INSULATED METAL-SUBSTRATE, IEICE transactions on electronics, E81C(3), 1998, pp. 439-446
Authors:
MAKINO M
ENDOH T
OGAWA Y
WATANABE K
FUJIMOTO Y
Citation: M. Makino et al., STUDIES ON THE METABOLITES OF PENICILLIUM-VULPINUM, Heterocycles, 48(9), 1998, pp. 1931-1934
Authors:
FUKUDA H
KOBAYASHI T
ENDOH T
NOMURA S
SAKAI A
UEDA Y
Citation: H. Fukuda et al., GROWTH AND CHARACTERIZATION OF GE NANOCRYSTALS IN ULTRATHIN SIO2-FILMS, Applied surface science, 132, 1998, pp. 776-780
Authors:
ENDOH T
SHIMIZU K
IIZUKA H
MASUOKA F
Citation: T. Endoh et al., A NEW WRITE ERASE METHOD TO IMPROVE THE READ DISTURB CHARACTERISTICS BASED ON THE DECAY PHENOMENA OF STRESS LEAKAGE CURRENT FOR MASH MEMORIES/, I.E.E.E. transactions on electron devices, 45(1), 1998, pp. 98-104
Authors:
NAGASE H
KAWAI K
HAYAKAWA J
WAKITA H
MIZUSUNA A
MATSUURA H
TAJIMA C
TAKEZAWA Y
ENDOH T
Citation: H. Nagase et al., RATIONAL DRUG DESIGN AND SYNTHESIS OF A HIGHLY SELECTIVE NONPEPTIDE DELTA-OPIOID AGONIST, 1,2,3,4,4A,5,12,12A-OCTAHYDROPYRIDO[3,4-B]ACRIDINE (TAN-67), Chemical and Pharmaceutical Bulletin, 46(11), 1998, pp. 1695-1702
Authors:
ENDOH T
SUZUKI T
Citation: T. Endoh et T. Suzuki, THE REGULATING MANNER OF OPIOID RECEPTORS ON DISTINCT TYPES OF CALCIUM CHANNELS IN HAMSTER SUBMANDIBULAR GANGLION-CELLS, Archives of oral biology, 43(3), 1998, pp. 221-233
Authors:
ENDOH T
MASUOKA F
Citation: T. Endoh et F. Masuoka, ENDURANCE CHARACTERISTICS OF FLASH EEPROMS, Electronics & communications in Japan. Part 2, Electronics, 80(1), 1997, pp. 88-95
Authors:
ENDOH T
NAKAMURA T
MASUOKA F
Citation: T. Endoh et al., AN ACCURATE MODEL OF FULLY-DEPLETED SURROUNDING GATE TRANSISTOR (FD-SGT), IEICE transactions on electronics, E80C(7), 1997, pp. 905-910
Authors:
ENDOH T
NAKAMURA T
MASUOKA F
Citation: T. Endoh et al., AN ANALYTIC STEADY-STATE CURRENT-VOLTAGE CHARACTERISTICS OF SHORT-CHANNEL FULLY-DEPLETED SURROUNDING GATE TRANSISTOR (FD-SGT), IEICE transactions on electronics, E80C(7), 1997, pp. 911-917
Authors:
ENDOH T
SHIMIZU K
IIZUKA H
MASUOKA F
Citation: T. Endoh et al., NEW REDUCTION-MECHANISM OF THE STRESS LEAKAGE CURRENT BASED ON THE DEACTIVATION OF STEP TUNNELING SITES FOR THIN OXIDE-FILMS, IEICE transactions on electronics, E80C(10), 1997, pp. 1310-1316
Authors:
ENDOH T
IIZUKA H
SHIROTA R
MASUOKA F
Citation: T. Endoh et al., NEW WRITE ERASE OPERATION TECHNOLOGY FOR FLASH EEPROM CELLS TO IMPROVE THE READ DISTURB CHARACTERISTICS/, IEICE transactions on electronics, E80C(10), 1997, pp. 1317-1323
Authors:
KIKUCHI T
SUZUKI K
ABE T
SATOH H
ENDOH T
HASEGAWA H
NAKAJI S
SUGAWARA K
KUMAE T
Citation: T. Kikuchi et al., MEASUREMENT OF CHEMILUMINESCENCE FROM NEUTROPHILS IN A 96-WELL MICROPLATE USING LUMI-BOX U-800-II, Journal of bioluminescence and chemiluminescence, 12(3), 1997, pp. 149-153
Authors:
KITTAKA S
HAMAGUCHI H
UMEZU T
ENDOH T
TAKENAKA T
Citation: S. Kittaka et al., INTERACTION OF NH3 WITH H2O IN THE VANADIUM PENTAOXIDE HYDRATE INTERLAYER SPACES - TOPOTACTIC CRYSTAL-GROWTH OF AMMONIUM VANADATE FILM, Langmuir, 13(5), 1997, pp. 1352-1358
Authors:
FUKUDA H
KOYAMA N
ENDOH T
NOMURA S
Citation: H. Fukuda et al., GROWTH-KINETICS OF NANOSCALE SIO2 LAYER IN A NITRIC-OXIDE (NO) AMBIENT, Applied surface science, 114, 1997, pp. 595-599
Authors:
DENDA A
ENDOH T
KITAYAMA W
TANG Q
NOGUCHI O
KOBAYASHI Y
AKAI H
OKAJIMA E
TSUJIUCHI T
TSUTSUMI M
NAKAE D
KONISHI Y
Citation: A. Denda et al., INHIBITION BY PIROXICAM OF OXIDATIVE DNA-DAMAGE, LIVER-CIRRHOSIS AND DEVELOPMENT OF ENZYME-ALTERED NODULES CAUSED BY A CHOLINE-DEFICIENT, L-AMINO ACID-DEFINED DIET IN RATS, Carcinogenesis, 18(10), 1997, pp. 1921-1930
Authors:
ENDOH T
SUZUKI T
Citation: T. Endoh et T. Suzuki, OPIOID-INDUCED INHIBITORY EFFECTS ON CALCIUM CURRENTS IN SUBMANDIBULAR GANGLION-CELLS, Journal of dental research, 76, 1997, pp. 1802-1802
Authors:
FUKUDA H
MURAI S
ENDOH T
NOMURA S
Citation: H. Fukuda et al., EFFECT OF OXYNITRIDATION ON CHARGE TRAPPING PROPERTIES OF ULTRATHIN SILICON DIOXIDE FILMS, Journal of applied physics, 81(4), 1997, pp. 1825-1828
Authors:
SEO H
ENDOH T
FUKUDA H
NOMURA S
Citation: H. Seo et al., HIGHLY SENSITIVE MOSFET GAS SENSORS WITH POROUS PLATINUM GATE ELECTRODE, Electronics Letters, 33(6), 1997, pp. 535-536