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Results: 1-7 |
Results: 7

Authors: LAUHAKANGAS R LAURIKAINEN P ORAVA R OSTONEN R PYYHTIA J SCHULMAN T SPARTIOTIS C HIETANEN I MATIKKALA M ERANEN S VIROLAINEN T
Citation: R. Lauhakangas et al., BEAM TEST-RESULTS OF A 60 CM LONG SILICON MICROSTRIP DETECTOR, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 364(1), 1995, pp. 74-78

Authors: JALAS P SIPILA H ERANEN S LEINONEN K
Citation: P. Jalas et al., NEAR ROOM-TEMPERATURE ENERGY-DISPERSIVE DETECTORS PROCESSED ON HIGH-PURITY SILICON, X-ray spectrometry, 24(2), 1995, pp. 63-69

Authors: GRAHN K ERANEN S KUIVALAINEN P
Citation: K. Grahn et al., DIAMOND POWER TRANSISTOR PERFORMANCE, DIAMOND AND RELATED MATERIALS, 3(11-12), 1994, pp. 1301-1307

Authors: GRAHN KJ KUIVALAINEN P ERANEN S
Citation: Kj. Grahn et al., EFFECT OF PARTIAL IONIZATION AND THE CHARACTERISTICS OF LATERAL POWERDIAMOND MESFETS, Physica scripta. T, 54, 1994, pp. 151-153

Authors: XIA Z SAARILAHTI J RISTOLAINEN E ERANEN S RONKAINEN H KUIVALAINEN P PAINE D TUOMI T
Citation: Z. Xia et al., AMORPHIZATION OF SILICON BY HIGH-DOSE GERMANIUM ION-IMPLANTATION WITHNO EXTERNAL COOLING MECHANISM, Applied surface science, 78(3), 1994, pp. 321-330

Authors: XIA Z SAARILAHTI J RONKAINEN H ERANEN S SUNI I MOLARIUS J KUIVALAINEN P RISTOLAINEN E TUOMI T
Citation: Z. Xia et al., RAPID THERMAL ANNEALING OF SI1-XGEX LAYERS FORMED BY GERMANIUM ION-IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 88(3), 1994, pp. 247-254

Authors: HUHTINEN M ORAVA R PIMIA M TUUVA T YLOSTALO J OSTERBERG K ERANEN S LEINONEN K HIETANEN I TURCHETTA R SCHAEFFER M
Citation: M. Huhtinen et al., SINGLE-SIDED STEREO ANGLE SILICON STRIP DETECTOR, IEEE transactions on nuclear science, 40(4), 1993, pp. 335-338
Risultati: 1-7 |