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Results: 1-10 |
Results: 10
Deposition of endohedral fullerenes from a laser evaporation cluster source
Authors: Neeb, M Klingeler, R Bechthold, PS Kann, G Wirth, I Eisebitt, S Eberhardt, W
Citation: M. Neeb et al., Deposition of endohedral fullerenes from a laser evaporation cluster source, APPL PHYS A, 72(3), 2001, pp. 289-293
La@C-60: A metallic endohedral fullerene
Authors: Klingeler, R Kann, G Wirth, I Eisebitt, S Bechthold, PS Neeb, M Eberhardt, W
Citation: R. Klingeler et al., La@C-60: A metallic endohedral fullerene, J CHEM PHYS, 115(15), 2001, pp. 7215-7218
Statistical analysis of the electronic structure of single-wall carbon nanotubes
Authors: Wirth, I Eisebitt, S Kann, G Eberhardt, W
Citation: I. Wirth et al., Statistical analysis of the electronic structure of single-wall carbon nanotubes, PHYS REV B, 61(8), 2000, pp. 5719-5723
Band structure information and resonant inelastic soft X-ray scattering inbroad band solids
Authors: Eisebitt, S Eberhardt, W
Citation: S. Eisebitt et W. Eberhardt, Band structure information and resonant inelastic soft X-ray scattering inbroad band solids, J ELEC SPEC, 110(1-3), 2000, pp. 335-358
Statistical analysis of the electronic structure of single-wall carbon nanotubes (vol 61, pg 5719, 2000)
Authors: Wirth, I Eisebitt, S Kann, G Eberhardt, W
Citation: I. Wirth et al., Statistical analysis of the electronic structure of single-wall carbon nanotubes (vol 61, pg 5719, 2000), PHYS REV B, 62(7), 2000, pp. 4756-4756
Coherent soft x-ray scattering from InP islands on a semiconductor substrate
Authors: Adamcyk, M Nicoll, C Pinnington, T Tiedje, T Eisebitt, S Karl, A Scherer, R Eberhardt, W
Citation: M. Adamcyk et al., Coherent soft x-ray scattering from InP islands on a semiconductor substrate, J VAC SCI B, 17(4), 1999, pp. 1728-1732
Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer
Authors: Eisebitt, S Luning, J Rubensson, JE Eberhardt, W
Citation: S. Eisebitt et al., Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer, PHYS ST S-B, 215(1), 1999, pp. 803-808
Surface roughness and resonant scattering effects in soft X-ray speckle from random semiconductor interfaces
Authors: Adamcyk, M Eisebitt, S Karl, A Nicoll, C Pinnington, T Scherer, R Tiedje, T Eberhardt, W
Citation: M. Adamcyk et al., Surface roughness and resonant scattering effects in soft X-ray speckle from random semiconductor interfaces, SURF REV L, 6(6), 1999, pp. 1121-1128
Electronic structure of silicon carbide polytypes studied by soft X-ray spectroscopy
Authors: Luning, J Eisebitt, S Rubensson, JE Ellmers, C Eberhardt, W
Citation: J. Luning et al., Electronic structure of silicon carbide polytypes studied by soft X-ray spectroscopy, PHYS REV B, 59(16), 1999, pp. 10573-10582
Soft X-ray spectroscopy of single sized CdS nanocrystals: size confinementand electronic structure
Authors: Luning, J Rockenberger, J Eisebitt, S Rubensson, JE Karl, A Kornowski, A Weller, H Eberhardt, W
Citation: J. Luning et al., Soft X-ray spectroscopy of single sized CdS nanocrystals: size confinementand electronic structure, SOL ST COMM, 112(1), 1999, pp. 5-9
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