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Results:
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Results: 5
Very-low-energy electron microscopy of doped semiconductors
Authors:
El-Gomati, MM Wells, TCR
Citation:
Mm. El-gomati et Tcr. Wells, Very-low-energy electron microscopy of doped semiconductors, APPL PHYS L, 79(18), 2001, pp. 2931-2933
Electron backscattering from real and in-situ treated surfaces
Authors:
Frank, L Stekly, R Zadrazil, M El-Gomati, MM Mullerova, I
Citation:
L. Frank et al., Electron backscattering from real and in-situ treated surfaces, MIKROCH ACT, 132(2-4), 2000, pp. 179-188
Fabrication of tungsten-coated silicon-based gated emitters
Authors:
Chen, L El-Gomati, MM
Citation:
L. Chen et Mm. El-gomati, Fabrication of tungsten-coated silicon-based gated emitters, J VAC SCI B, 17(2), 1999, pp. 638-641
Field emission studies of tungsten-coated silicon-based field emitters
Authors:
Chen, L El-Gomati, MM
Citation:
L. Chen et Mm. El-gomati, Field emission studies of tungsten-coated silicon-based field emitters, ULTRAMICROS, 79(1-4), 1999, pp. 135-140
Monte Carlo simulations of nanometric structures analysis of micromachinedfield emitters
Authors:
Assa'd, AMD El-Gomati, MM Dell, J
Citation:
Amd. Assa'D et al., Monte Carlo simulations of nanometric structures analysis of micromachinedfield emitters, ULTRAMICROS, 79(1-4), 1999, pp. 141-147
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