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Results:
1-10
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Results: 10
Authors:
Eremin, YA
Stover, JC
Grishina, NV
Citation: Ya. Eremin et al., Discrete sources method for light scattering analysis from 3D asymmetricalfeatures on a substrate, J QUAN SPEC, 70(4-6), 2001, pp. 421-431
Authors:
Eremin, YA
Citation: Ya. Eremin, The method of discrete sources in electromagnetic scattering by axially symmetric structures, J COMMUN T, 45, 2000, pp. S269-S280
Authors:
Grishina, NV
Eremin, YA
Citation: Nv. Grishina et Ya. Eremin, Analysis of the scattering properties of nonspherical microparticles on a substrate, OPT SPECTRO, 89(3), 2000, pp. 390-396
Authors:
Grishina, NV
Eremin, YA
Citation: Nv. Grishina et Ya. Eremin, Analysis of the scattering properties of defects of layered substrates, OPT SPECTRO, 88(2), 2000, pp. 246-252
Authors:
Doicu, A
Eremin, YA
Wriedt, T
Citation: A. Doicu et al., T- and D-matrix methods for electromagnetic scattering by impedance obstacles, COMP PHYS C, 124(1), 2000, pp. 19-27
Authors:
Eremin, YA
Stover, JC
Orlov, NV
Citation: Ya. Eremin et al., Modeling scatter from silicon wafer features based on discrete sources method, OPT ENG, 38(8), 1999, pp. 1296-1304
Authors:
Doicu, A
Eremin, YA
Wriedt, T
Citation: A. Doicu et al., Convergence of the T-matrix method for light scattering from a particle onor near a surface, OPT COMMUN, 159(4-6), 1999, pp. 266-277
Authors:
Grishina, NV
Eremin, YA
Citation: Nv. Grishina et Ya. Eremin, Analysis of light scattering by defects of a hole in a film deposited on asubstrate, OPT SPECTRO, 86(3), 1999, pp. 415-420
Authors:
Doicu, A
Eremin, YA
Wriedt, T
Citation: A. Doicu et al., Projection schemes in the null field method, J QUAN SPEC, 63(2-6), 1999, pp. 175-189
Authors:
Eremin, YA
Orlov, NV
Citation: Ya. Eremin et Nv. Orlov, Study of scattering properties of defects of silicone wafers, OPT SPECTRO, 84(4), 1998, pp. 557-562
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