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Results: 1-25/27
Authors:
Sanchez-Lopez, JC
Rojas, TC
Espinos, JP
Fernandez, A
Citation: Jc. Sanchez-lopez et al., "In situ" XPS study of the oxygen passivation process in vapour-condensed nanocrystalline iron and cobalt, SCR MATER, 44(8-9), 2001, pp. 2331-2334
Authors:
Cotrino, J
Palmero, A
Rico, V
Barranco, A
Espinos, JP
Gonzalez-Elipe, AR
Citation: J. Cotrino et al., Electron temperature measurement in a slot antenna 2.45 GHz microwave plasma source, J VAC SCI B, 19(2), 2001, pp. 410-414
Authors:
Barranco, A
Holgado, JP
Yubero, F
Espinos, JP
Martin, A
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N-2(+) bombardment, J VAC SCI A, 19(3), 2001, pp. 1024-1026
Authors:
Barranco, A
Mejias, JA
Espinos, JP
Caballero, A
Gonzalez-Elipe, AR
Yubero, F
Citation: A. Barranco et al., Chemical stability of Sin+ species in SiOx (x < 2) thin films, J VAC SCI A, 19(1), 2001, pp. 136-144
Authors:
Barranco, A
Yubero, F
Espinos, JP
Benitez, J
Gonzalez-Elipe, AR
Cotrino, J
Allain, J
Girardeau, T
Riviere, JP
Citation: A. Barranco et al., Room temperature synthesis of SiO2 thin films by ion beam induced and plasma enhanced CVD, SURF COAT, 142, 2001, pp. 856-860
Authors:
Barranco, A
Yubero, F
Espinos, JP
Gonzalez-Eipe, AR
Citation: A. Barranco et al., The chemical state vector: a new concept for the characterization of oxideinterfaces, SURF INT AN, 31(8), 2001, pp. 761-767
Authors:
Barranco, A
Yubero, F
Cotrino, J
Espinos, JP
Benitez, J
Rojas, TC
Allain, J
Girardeau, T
Reviere, JP
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Low temperature synthesis of dense SiO2 thin films by ion beam induced chemical vapor deposition, THIN SOL FI, 396(1-2), 2001, pp. 9-15
Authors:
Holgado, JP
Espinos, JP
Yubero, F
Justo, A
Ocana, M
Benitez, J
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Ar stabilisation of the cubic/tetragonal phases of ZrO2 in thin films prepared by ion beam induced chemical vapour deposition, THIN SOL FI, 389(1-2), 2001, pp. 34-42
Authors:
Holgado, JP
Barranco, A
Yubero, F
Espinos, JP
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Surface microstructure of MgO deposited on SiO2 by analysis of plasmon excitations in photoemission experiments, SURF SCI, 482, 2001, pp. 1325-1330
Authors:
Barranco, A
Yubero, F
Mejias, JA
Espinos, JP
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Electronic interactions at SiO2/M ' O-x (M ': Al, Ti) oxide interfaces, SURF SCI, 482, 2001, pp. 680-686
Authors:
Hernan, L
Morales, J
Sanchez, L
Santos, J
Espinos, JP
Gonzalez-Elipe, AR
Holgado, JP
Citation: L. Hernan et al., Study of in situ adsorption and intercalation of cobaltocene into SnS2 single crystals by photoelectron spectroscopy, SURF SCI, 477(2-3), 2001, pp. L295-L300
Authors:
Gonzalez-Elipe, AR
Yubero, F
Espinos, JP
Caballero, A
Ocana, M
Holgado, JP
Morales, J
Citation: Ar. Gonzalez-elipe et al., Amorphisation and related structural effects in thin films prepared by ionbeam assisted methods, SURF COAT, 125(1-3), 2000, pp. 116-123
Authors:
Holgado, JP
Munuera, G
Espinos, JP
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., XPS study of oxidation processes of CeOx defective layers, APPL SURF S, 158(1-2), 2000, pp. 164-171
Authors:
Espinos, JP
Gonzalez-Elipe, AR
Mohai, M
Bertoti, I
Citation: Jp. Espinos et al., Surface chemical effects of low-energy N-2(+) ion bombardment on single crystalline alpha-Al2O3, SURF INT AN, 30(1), 2000, pp. 90-94
Authors:
Holgado, JP
Caballero, A
Espinos, JP
Morales, J
Jimenez, VM
Justo, A
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Characterisation by X-ray absorption spectroscopy of oxide thin films prepared by ion beam-induced CVD, THIN SOL FI, 377, 2000, pp. 460-466
Authors:
Yubero, F
Barranco, A
Mejias, JA
Espinos, JP
Gonzalez-Elipe, AR
Citation: F. Yubero et al., Spectroscopic characterisation and chemical reactivity of silicon monoxidelayers deposited on Cu(100), SURF SCI, 458(1-3), 2000, pp. 229-238
Authors:
Reiche, R
Yubero, F
Espinos, JP
Gonzalez-Elipe, AR
Citation: R. Reiche et al., Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies, SURF SCI, 457(1-2), 2000, pp. 199-210
Authors:
Morales, J
Santos, J
Barrado, JRR
Espinos, JP
Gonzalez-Elipe, AR
Citation: J. Morales et al., Synthesis and characterization of diamine intercalation compounds of SnS2 single crystals, J SOL ST CH, 150(2), 2000, pp. 391-398
Authors:
Gonzalez-Elipe, AR
Espinos, JP
Barranco, A
Yubero, F
Caballero, A
Citation: Ar. Gonzalez-elipe et al., CVD induced by ion beams for the preparation of oxide and nitride thin films, J PHYS IV, 9(P8), 1999, pp. 699-708
Authors:
Jimenez, VM
Espinos, JP
Gonzalez-Elipe, AR
Caballero, A
Yubero, F
Citation: Vm. Jimenez et al., SnO2 thin films prepared by ion beam induced CVD. Preparation and characterization, J PHYS IV, 9(P8), 1999, pp. 749-755
Authors:
Jimenez, VM
Espinos, JP
Gonzalez-Elipe, AR
Citation: Vm. Jimenez et al., Effect of texture and annealing treatments in SnO2 and Pd/SnO2 gas sensor materials, SENS ACTU-B, 61(1-3), 1999, pp. 23-32
Authors:
Jimenez, VM
Espinos, JP
Gonzalez-Elipe, AR
Citation: Vm. Jimenez et al., Determination of thin film growth mechanisms of deposited metal oxides by a combined use of ISS and XPS, APPL SURF S, 141(1-2), 1999, pp. 186-192
Authors:
Jimenez, VM
Caballero, A
Fernandez, A
Espinos, JP
Ocana, M
Gonzalez-Elipe, AR
Citation: Vm. Jimenez et al., Structural characterization of partially amorphous SnO2 nanoparticles by factor analysis of XAS and FT-IR spectra, SOL ST ION, 116(1-2), 1999, pp. 117-127
Authors:
Jimenez, VM
Lassaletta, G
Fernandez, A
Espinos, JP
Yubero, F
Gonzalez-Elipe, AR
Soriano, L
Sanz, JM
Papaconstantopoulos, DA
Citation: Vm. Jimenez et al., Resonant photoemission characterization of SnO, PHYS REV B, 60(15), 1999, pp. 11171-11179
Authors:
Jimenez, VM
Espinos, JP
Caballero, A
Contreras, L
Fernandez, A
Justo, A
Gonzalez-Elipe, AR
Citation: Vm. Jimenez et al., SnO2 thin films prepared by ion beam induced CVD: preparation and characterization by X-ray absorption spectroscopy, THIN SOL FI, 353(1-2), 1999, pp. 113-123