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Results:
1-17
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Results: 17
Authors:
BECKERS U
STENZEL O
WILBRANDT S
FALKE U
VONBORCZYSKOWSKI C
Citation: U. Beckers et al., THE OPTICAL-ABSORPTION OF ULTRATHIN ORGANIC MOLECULAR FILMS - THE THICKNESS DEPENDENCE OF THE ABSORPTION-LINE POSITION, Journal of physics. Condensed matter, 10(8), 1998, pp. 1721-1732
Authors:
WEISSMANTEL S
REISSE G
KEIPER B
WEBER A
FALKE U
RODER M
Citation: S. Weissmantel et al., PULSED-LASER DEPOSITION AND MODIFICATION OF CUBIC BORON-NITRIDE FILMS, Applied surface science, 129, 1998, pp. 444-450
Authors:
REISSE G
KEIPER B
WEISSMANTEL S
FALKE U
Citation: G. Reisse et al., PULSED-LASER DEPOSITION AND MODIFICATION OF DIAMOND-LIKE CARBON-FILMS, Applied surface science, 129, 1998, pp. 500-506
Authors:
FIRSZT F
CICHOS A
DLUZEWSKI P
FALKE U
HIETSCHOLD M
LENZNER J
LEGOWSKI S
MECZYNSKA H
PASZKOWICZ W
Citation: F. Firszt et al., COEXISTENCE OF 2H AND 4H POLYTYPES IN ZN1-XMGXSE OBSERVED BY PHOTOLUMINESCENCE AND CATHODOLUMINESCENCE, Solid state communications, 108(6), 1998, pp. 367-370
Authors:
FALKE U
CICHOS A
FIRSZT F
MECZYNSKA H
DLUZEWSKI P
PASZKOWICZ W
LENZNER J
HIETSCHOLD M
Citation: U. Falke et al., STRUCTURAL INVESTIGATIONS OF POLYTYPES IN ZN1-XMGXSE BY TRANSMISSION ELECTRON-MICROSCOPY AND CATHODOLUMINESCENCE, Journal of crystal growth, 185, 1998, pp. 1015-1020
Authors:
FALKE U
WEBER A
KUHN M
SPATH C
HIETSCHOLD M
Citation: U. Falke et al., EXELFS-INVESTIGATIONS OF CARBON AND CARBON NITRIDE FILMS, European journal of cell biology, 74, 1997, pp. 51-51
Authors:
BRUSKA A
ASTROVA EV
FALKE U
RASCHKE T
RADEHAUS C
HIETSCHOLD M
Citation: A. Bruska et al., EVIDENCE OF ANISOTROPIC STRUCTURES OF FREESTANDING POROUS SILICON FILMS, Thin solid films, 297(1-2), 1997, pp. 79-83
Authors:
FALKE U
FENSKE F
SCHULZE S
HIETSCHOLD M
Citation: U. Falke et al., XTEM STUDIES OF NICKEL SILICIDE GROWTH ON SI(100) USING A NI TI BILAYER SYSTEM/, Physica status solidi. a, Applied research, 162(2), 1997, pp. 615-621
Authors:
RODER M
HAHN J
FALKE U
SCHULZE S
RICHTER F
HIETSCHOLD M
Citation: M. Roder et al., ELECTRON-MICROSCOPIC PHASE-ANALYSIS OF BN-THIN FILMS, Mikrochimica acta, 125(1-4), 1997, pp. 283-286
Authors:
KOLITSCH A
SUMMCHEN L
ULLMANN J
FALKE U
HEGER P
Citation: A. Kolitsch et al., POSTIMPLANTATION OF IONS INTO AMORPHOUS-CARBON FILMS, Surface & coatings technology, 84(1-3), 1996, pp. 495-499
Authors:
HIETSCHOLD M
SCHULZE S
FALKE U
FENSKE F
WOLKE W
Citation: M. Hietschold et al., HRTEM CHARACTERIZATION OF THE NISI2 GROWTH INTO THE SI(111) SURFACE, Applied surface science, 102, 1996, pp. 156-158
Authors:
FALKE U
WEBER AK
ULLMANN J
Citation: U. Falke et al., DISPERSION OF THE VALENCE ELECTRON-ENERGY-LOSS IN THIN AMORPHOUS-CARBON FILMS DEPOSITED BY ION-ASSISTED EVAPORATION OF GRAPHITE, Microscopy microanalysis microstructures, 6(1), 1995, pp. 113-120
Authors:
STEINER A
FALKE U
Citation: A. Steiner et U. Falke, EXTRACTION OF THE TRUE AUGER LINESHAPE OF GRAPHITE AND DIAMOND FROM EXPERIMENTAL-DATA USING FAST FOURIER TRANSFORMATION, Surface and interface analysis, 23(11), 1995, pp. 789-793
Authors:
FALKE M
GRAHLERT X
FALKE U
SCHULZE S
HIETSCHOLD M
Citation: M. Falke et al., STRUCTURAL IMAGING OF LANTHANOIDE DIPHTHALOCYANINES BY TRANSMISSION ELECTRON-MICROSCOPY, Physica status solidi. a, Applied research, 150(1), 1995, pp. 359-369
Authors:
FALKE U
Citation: U. Falke, INVESTIGATIONS OF THIN HYDROGENATED AMORPHOUS-CARBON FILMS USING ELECTRON-ENERGY-LOSS SPECTROSCOPY (EELS), Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 241-241
Authors:
FLOTER A
MAINZ B
STIEGLER J
FALKE U
SCHULZE S
DEUTSCHMANN S
SCHAARSCHMIDT G
Citation: A. Floter et al., MICROSCOPIC INVESTIGATIONS OF SILICON SURFACES PRETREATED FOR USE IN DIAMOND DEPOSITION, DIAMOND AND RELATED MATERIALS, 3(8), 1994, pp. 1097-1102
Authors:
ULLMANN J
FALKE U
SCHARFF W
SCHROER A
WOLF GK
Citation: J. Ullmann et al., NOBLE-GAS ION-ASSISTED EVAPORATION OF CARBON, Thin solid films, 232(2), 1993, pp. 154-160
Risultati:
1-17
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