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Results: 1-17 |
Results: 17

Authors: ROGALLA M LIEN Y PERCIVAL R HORNUNG M LUDWIG J IRSIGLER R RUNGE K SOLDNERREMBOLD A MEINHARDT J FELDGEN T FIEDERLE M BENZ KW
Citation: M. Rogalla et al., THE IMPACT OF DEEP ACCEPTORS ON THE PERFORMANCE OF VPE-GAAS X-RAY-DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 410(1), 1998, pp. 92-95

Authors: FIEDERLE M BENZ KW DUFFAR T
Citation: M. Fiederle et al., APPLICATION OF MICROGRAVITY SOLIDIFICATION RESULTS TO THE GROWTH OF BULK CDTE AND RELATED MATERIALS, Journal of crystal growth, 185, 1998, pp. 1339-1339

Authors: JOERGER W LAASCH M KUNZ T FIEDERLE M MEINHARDT J BENZ KW SCHOLZ K WENDL W MULLERVOGT G
Citation: W. Joerger et al., COMPENSATION MECHANISM IN VANADIUM AND GALLIUM DOPED CDTE AND (CD,ZN)TE, Crystal research and technology, 32(8), 1997, pp. 1103-1113

Authors: LAASCH M KUNZ T EICHE C FIEDERLE M JOERGER W KLOESS G BENZ KW
Citation: M. Laasch et al., GROWTH OF TWIN-FREE CDTE SINGLE-CRYSTALS IN A SEMICLOSED VAPOR-PHASE SYSTEM, Journal of crystal growth, 174(1-4), 1997, pp. 696-707

Authors: ROGALLA M CHEN JW GEPPERT R KIENZLE M IRSIGLER R LUDWIG J RUNGE K FIEDERLE M BENZ KW SCHMID TH DAVIA C LAUXTERMANN S LIU X KRUEGER J WEBER ER
Citation: M. Rogalla et al., CHARACTERIZATION OF SEMIINSULATING GAAS FOR DETECTOR APPLICATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 380(1-2), 1996, pp. 14-17

Authors: FIEDERLE M ROGALLA M JOERGER C SALK M EBLING DG LUDWIG J RUNGE K BENZ KW
Citation: M. Fiederle et al., CHARACTERIZATION OF CDTE0.9SE0.1-CL STRIP DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 380(1-2), 1996, pp. 153-156

Authors: EICHE C JOERGER W FIEDERLE M EBLING D SALK M SCHWARZ R BENZ KW
Citation: C. Eiche et al., CHARACTERIZATION OF CDTE-CL CRYSTALS GROWN UNDER MICROGRAVITY CONDITIONS BY TIME-DEPENDENT CHARGE MEASUREMENTS (TDCM), Journal of crystal growth, 166(1-4), 1996, pp. 245-250

Authors: FIEDERLE M EICHE C JOERGER W SALK M SENCHENKOV AS EGOROV AV EBLING DG BENZ KW
Citation: M. Fiederle et al., RADIATION DETECTOR PROPERTIES OF CDTE0.9SE0.1 CL CRYSTALS GROWN UNDERMICROGRAVITY IN A ROTATING MAGNETIC-FIELD/, Journal of crystal growth, 166(1-4), 1996, pp. 256-260

Authors: EICHE C JOERGER W FIEDERLE M EBLING D SCHWARZ R BENZ KW
Citation: C. Eiche et al., CHARACTERIZATION OF TI AND V DOPED CDTE BY TIME-DEPENDENT CHARGE MEASUREMENT (TDCM) AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS), Optical materials, 4(2-3), 1995, pp. 214-218

Authors: CHEN JW FROMMICHEN T LUDWIG J KOHLER M PLOTZE T ROGALLA M RUNGE K EBLING DG FIEDERLE M HUG P
Citation: Jw. Chen et al., EVALUATION OF ACTIVE LAYER PROPERTIES AND CHARGE COLLECTION EFFICIENCY OF GAAS PARTICLE DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 365(2-3), 1995, pp. 273-284

Authors: SCHWARZ R JOERGER W EICHE C FIEDERLE M BENZ KW
Citation: R. Schwarz et al., CLOSED TUBE VAPOR GROWTH OF CDTE-V AND CDTE-TI AND ITS CHARACTERIZATION, Journal of crystal growth, 146(1-4), 1995, pp. 92-97

Authors: EICHE C JOERGER W FIEDERLE M EBLING D SCHWARZ R BENZ KW
Citation: C. Eiche et al., INVESTIGATION OF CDTE-CL GROWN FROM THE VAPOR-PHASE UNDER MICROGRAVITY CONDITIONS WITH TIME-DEPENDENT CHARGE MEASUREMENTS AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY, Journal of crystal growth, 146(1-4), 1995, pp. 98-103

Authors: LAASCH M SCHWARZ R JOERGER W EICHE C FIEDERLE M BENZ KW GRASZA K
Citation: M. Laasch et al., CHARACTERIZATION OF CADMIUM TELLURIDE CRYSTALS GROWN BY DIFFERENT TECHNIQUES FROM THE VAPOR-PHASE, Journal of crystal growth, 146(1-4), 1995, pp. 125-129

Authors: FIEDERLE M EBLING D EICHE C HUG P JOERGER W LAASCH M SCHWARZ R SALK M BENZ KW
Citation: M. Fiederle et al., STUDIES OF THE COMPENSATION MECHANISM IN CDTE GROWN FROM THE VAPOR-PHASE, Journal of crystal growth, 146(1-4), 1995, pp. 142-147

Authors: MAIER D HUG P FIEDERLE M EICHE C EBLING D WEESE J
Citation: D. Maier et al., HIGH-RESOLUTION METHOD FOR THE ANALYSIS OF ADMITTANCE SPECTROSCOPY DATA, Journal of applied physics, 77(8), 1995, pp. 3851-3857

Authors: SALK M FIEDERLE M BENZ KW SENCHENKOV AS EGOROV AV MATIOUKHIN DG
Citation: M. Salk et al., CDTE AND CDTE0.9SE0.1 CRYSTALS GROWN BY THE TRAVELING HEATER METHOD USING A ROTATING MAGNETIC-FIELD, Journal of crystal growth, 138(1-4), 1994, pp. 161-167

Authors: FIEDERLE M EBLING D EICHE C HOFMANN DM SALK M STADLER W BENZ KW MEYER BK
Citation: M. Fiederle et al., COMPARISON OF CDTE, CD0.9ZN0.1TE AND CDTE0.9SE0.1 CRYSTALS - APPLICATION FOR GAMMA-RAY AND X-RAY-DETECTORS, Journal of crystal growth, 138(1-4), 1994, pp. 529-533
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