Citation: Jp. Hebb et al., THERMAL-RADIATION ABSORPTION IN DOPED SEMICONDUCTORS DUE TO DIRECT INTERSUBBAND TRANSITIONS, Journal of heat transfer, 117(4), 1995, pp. 948-954
Citation: Ke. Goodson et al., PREDICTION AND MEASUREMENT OF TEMPERATURE-FIELDS IN SILICON-ON-INSULATOR ELECTRONIC-CIRCUITS, Journal of heat transfer, 117(3), 1995, pp. 574-581
Citation: Zm. Zhang et al., INFRARED REFRACTIVE-INDEXES OF LAALO3, AND LAGAO3, AND NDGAO3, Journal of the Optical Society of America. B, Optical physics, 11(11), 1994, pp. 2252-2257
Citation: Ke. Goodson et al., PREDICTION AND MEASUREMENT OF THE THERMAL-CONDUCTIVITY OF AMORPHOUS DIELECTRIC LAYERS, Journal of heat transfer, 116(2), 1994, pp. 317-324
Authors:
FUSHINOBU K
PHELAN PE
HIJIKATA K
NAGASAKI T
FLIK MI
Citation: K. Fushinobu et al., THERMAL-ANALYSIS OF THE PERFORMANCE OF A HIGH-T(C) SUPERCONDUCTING MICROBOLOMETER, Journal of heat transfer, 116(1), 1994, pp. 275-278
Citation: Zh. Zhou et al., EPIFILM THICKNESS MEASUREMENTS USING FOURIER-TRANSFORM INFRARED-SPECTROSCOPY - EFFECT OF REFRACTIVE-INDEX DISPERSION AND REFRACTIVE-INDEX MEASUREMENT, Journal of applied physics, 76(4), 1994, pp. 2448-2454
Citation: Ke. Goodson et al., ANNEALING-TEMPERATURE DEPENDENCE OF THE THERMAL-CONDUCTIVITY OF LPCVDSILICON-DIOXIDE LAYERS, IEEE electron device letters, 14(10), 1993, pp. 490-492
Authors:
CHOI BI
ANDERSON AC
WESTERHEIM AC
FLIK MI
Citation: Bi. Choi et al., IN-SITU SUBSTRATE-TEMPERATURE MEASUREMENT IN HIGH-TC SUPERCONDUCTING FILM DEPOSITION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 11(6), 1993, pp. 3020-3025