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Results: 1-14 |
Results: 14
SIGE ISLAND SHAPE TRANSITIONS INDUCED BY ELASTIC REPULSION
Authors: FLORO JA LUCADAMO GA CHASON E FREUND LB SINCLAIR M TWESTEN RD HWANG RQ
Citation: Ja. Floro et al., SIGE ISLAND SHAPE TRANSITIONS INDUCED BY ELASTIC REPULSION, Physical review letters, 80(21), 1998, pp. 4717-4720
DYNAMIC SELF-ORGANIZATION OF STRAINED ISLANDS DURING SIGE EPITAXIAL-GROWTH
Authors: FLORO JA CHASON E SINCLAIR MB FREUND LB LUCADAMO GA
Citation: Ja. Floro et al., DYNAMIC SELF-ORGANIZATION OF STRAINED ISLANDS DURING SIGE EPITAXIAL-GROWTH, Applied physics letters, 73(7), 1998, pp. 951-953
SPECTROSCOPIC LIGHT-SCATTERING FOR REAL-TIME MEASUREMENTS OF THIN-FILM AND SURFACE EVOLUTION
Authors: CHASON E SINCLAIR MB FLORO JA HUNTER JA HWANG RQ
Citation: E. Chason et al., SPECTROSCOPIC LIGHT-SCATTERING FOR REAL-TIME MEASUREMENTS OF THIN-FILM AND SURFACE EVOLUTION, Applied physics letters, 72(25), 1998, pp. 3276-3278
REAL-TIME STRESS EVOLUTION DURING SI1-XGEX HETEROEPITAXY - DISLOCATIONS, ISLANDING, AND SEGREGATION
Authors: FLORO JA CHASON E LEE SR TWESTEN RD HWANG RQ FREUND LB
Citation: Ja. Floro et al., REAL-TIME STRESS EVOLUTION DURING SI1-XGEX HETEROEPITAXY - DISLOCATIONS, ISLANDING, AND SEGREGATION, Journal of electronic materials, 26(9), 1997, pp. 969-979
INTERACTION OF CAVITIES WITH MISFIT DISLOCATIONS IN SIGE SI HETEROSTRUCTURES/
Authors: FOLLSTAEDT DM MYERS SM FLORO JA LEE SR
Citation: Dm. Follstaedt et al., INTERACTION OF CAVITIES WITH MISFIT DISLOCATIONS IN SIGE SI HETEROSTRUCTURES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 375-378
SIGE COHERENT ISLANDING AND STRESS-RELAXATION IN THE HIGH-MOBILITY REGIME
Authors: FLORO JA CHASON E TWESTEN RD HWANG RQ FREUND LB
Citation: Ja. Floro et al., SIGE COHERENT ISLANDING AND STRESS-RELAXATION IN THE HIGH-MOBILITY REGIME, Physical review letters, 79(20), 1997, pp. 3946-3949
BIAXIAL MODULI OF COHERENT SI1-XGEX FILMS ON SI(001)
Authors: FLORO JA CHASON E LEE SR PETERSEN GA
Citation: Ja. Floro et al., BIAXIAL MODULI OF COHERENT SI1-XGEX FILMS ON SI(001), Applied physics letters, 71(12), 1997, pp. 1694-1696
MEASURING GE SEGREGATION BY REAL-TIME STRESS MONITORING DURING SI1-XGEX MOLECULAR-BEAM EPITAXY
Authors: FLORO JA CHASON E
Citation: Ja. Floro et E. Chason, MEASURING GE SEGREGATION BY REAL-TIME STRESS MONITORING DURING SI1-XGEX MOLECULAR-BEAM EPITAXY, Applied physics letters, 69(25), 1996, pp. 3830-3832
OPTICAL CHARACTERIZATION OF SI1-XCX SS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.014) SEMICONDUCTOR ALLOYS/
Authors: LEE HS KURTZ SR FLORO JA STRANE J SEAGER CH LEE SR JONES ED NELSON JF MAYER T PICRAUX ST
Citation: Hs. Lee et al., OPTICAL CHARACTERIZATION OF SI1-XCX SS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.014) SEMICONDUCTOR ALLOYS/, JPN J A P 2, 34(10B), 1995, pp. 1340-1343
DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING
Authors: KELLERMAN BK FLORO JA CHASON E BRICE DK PICRAUX ST WHITE JM
Citation: Bk. Kellerman et al., DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 972-978
SURFACE DEFECT PRODUCTION ON GE(001) DURING LOW-ENERGY ION-BOMBARDMENT
Authors: FLORO JA KELLERMAN BK CHASON E PICRAUX ST BRICE DK HORN KM
Citation: Ja. Floro et al., SURFACE DEFECT PRODUCTION ON GE(001) DURING LOW-ENERGY ION-BOMBARDMENT, Journal of applied physics, 77(6), 1995, pp. 2351-2357
THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH
Authors: KELLERMAN BK CHASON E FLORO JA PICRAUX ST WHITE JM
Citation: Bk. Kellerman et al., THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH, Applied physics letters, 67(12), 1995, pp. 1703-1705
COMPETITION BETWEEN STRAIN AND INTERFACE ENERGY DURING EPITAXIAL GRAIN-GROWTH IN AG FILMS ON NI(001)
Authors: FLORO JA THOMPSON CV CAREL R BRISTOWE PD
Citation: Ja. Floro et al., COMPETITION BETWEEN STRAIN AND INTERFACE ENERGY DURING EPITAXIAL GRAIN-GROWTH IN AG FILMS ON NI(001), Journal of materials research, 9(9), 1994, pp. 2411-2424
OXYGEN ROUGHENING OF GE(001) SURFACES
Authors: HORN KM CHASON E TSAO JY FLORO JA PICRAUX ST
Citation: Km. Horn et al., OXYGEN ROUGHENING OF GE(001) SURFACES, Surface science, 320(1-2), 1994, pp. 174-184
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