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Results:
1-6
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Results: 6
Reflectivity of W/Si multilayer at the photo-energies of 700 eV and 1200 eV
Authors:
Feng, SM Zhu, GL Shao, JD Yi, K Fan, ZX
Citation:
Sm. Feng et al., Reflectivity of W/Si multilayer at the photo-energies of 700 eV and 1200 eV, CHIN PHYS L, 18(11), 2001, pp. 1481-1482
Study of thin-film SO2 gas sensors by photometric and ellipsometric methods
Authors:
Tang, ZS Fan, ZX Shao, JD
Citation:
Zs. Tang et al., Study of thin-film SO2 gas sensors by photometric and ellipsometric methods, OPT ENG, 40(5), 2001, pp. 856-860
Laser-induced damage of a 1064-nm ZnS/MgF2 narrow-band interference filter
Authors:
Hu, HY Fan, ZX Luo, F
Citation:
Hy. Hu et al., Laser-induced damage of a 1064-nm ZnS/MgF2 narrow-band interference filter, APPL OPTICS, 40(12), 2001, pp. 1950-1956
Sputtering of ZnO buffer layer on Si for GaN blue light emitting materials
Authors:
He, HB Fan, ZX Yao, ZY Tang, ZS
Citation:
Hb. He et al., Sputtering of ZnO buffer layer on Si for GaN blue light emitting materials, SCI CHINA E, 43(1), 2000, pp. 55-59
Measuring weak absorptance of thin film coatings by surface thermal lensing technique
Authors:
Hu, HY Fan, ZX Liu, Y
Citation:
Hy. Hu et al., Measuring weak absorptance of thin film coatings by surface thermal lensing technique, LASER PHYS, 10(2), 2000, pp. 633-639
Microstructure and optical properties of Ag5In5Te47Sb33 phase change thin films with high reflection in thermal annealing process
Authors:
Liu, HY Jiang, FS Men, LQ Fan, ZX
Citation:
Hy. Liu et al., Microstructure and optical properties of Ag5In5Te47Sb33 phase change thin films with high reflection in thermal annealing process, CHIN SCI B, 43(24), 1998, pp. 2078-2082
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