Authors:
Svrcek, V
Pelant, I
Kocka, J
Fejfar, A
Tousek, J
Kondo, M
Matsuda, A
Citation: V. Svrcek et al., A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers, PHIL MAG L, 81(6), 2001, pp. 405-410
Authors:
Svrcek, V
Pelant, I
Stuchlik, J
Fejfar, A
Kocka, J
Citation: V. Svrcek et al., Detection of bottom depletion layer and its influence on surface photovoltage measurement in mu c-Si : H, THIN SOL FI, 383(1-2), 2001, pp. 271-273
Authors:
Svrcek, V
Pelant, I
Kocka, J
Fojtik, P
Rezek, B
Stuchlikova, H
Fejfar, A
Stuchlik, J
Poruba, A
Tousek, J
Citation: V. Svrcek et al., Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length, J APPL PHYS, 89(3), 2001, pp. 1800-1805
Authors:
Kocka, J
Stuchlik, J
Stuchlikova, H
Svrcek, V
Fojtik, P
Mates, T
Luterova, K
Fejfar, A
Citation: J. Kocka et al., Amorphous/microcrystalline silicon superlattices - the chance to control isotropy and other transport properties, APPL PHYS L, 79(16), 2001, pp. 2540-2542
Authors:
Fejfar, A
Rezek, B
Knapek, P
Stuchlik, J
Kocka, J
Citation: A. Fejfar et al., Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy, J NON-CRYST, 266, 2000, pp. 309-314
Authors:
Juska, G
Genevicius, K
Viliunas, M
Arlauskas, K
Stuchlikova, H
Fejfar, A
Kocka, J
Citation: G. Juska et al., New method of drift mobility evaluation in mu c-Si : H, basic idea and comparison with time-of-flight, J NON-CRYST, 266, 2000, pp. 331-335
Authors:
Nakahata, K
Kamiya, T
Fortmann, CM
Shimizu, I
Stuchlikova, H
Fejfar, A
Kocka, J
Citation: K. Nakahata et al., Anisotropic carrier transport in preferentially oriented polycrystalline silicon films fabricated by very-high-frequency plasma enhanced chemical vapor deposition using fluorinated source gas, J NON-CRYST, 266, 2000, pp. 341-346
Authors:
Poruba, A
Fejfar, A
Remes, Z
Springer, J
Vanecek, M
Kocka, J
Meier, J
Torres, P
Shah, A
Citation: A. Poruba et al., Optical absorption and light scattering in microcrystalline silicon thin films and solar cells, J APPL PHYS, 88(1), 2000, pp. 148-160
Citation: B. Rezek et al., Local characterization of electronic transport in microcrystalline siliconthin films with submicron resolution, APPL PHYS L, 74(10), 1999, pp. 1475-1477
Authors:
Rezek, B
Stuchlik, J
Fejfar, A
Kocka, J
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Characterization of laser patterned a-Si : H thin films by combined AFM local current measurements, PHYS ST S-A, 170(1), 1998, pp. R1-R2