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Results: 1-8 |
Results: 8

Authors: Boucaud, P Brunhes, T Sauvage, S Yam, N Le Thanh, V Bouchier, D Rappaport, N Finkman, E
Citation: P. Boucaud et al., Midinfrared photoconductivity in Ge/Si self-assembled quantum dots, PHYS ST S-B, 224(1), 2001, pp. 233-236

Authors: Finkman, E Maimon, S Immer, V Bahir, G Schacham, SE Fossard, F Julien, FH Brault, J Gendry, M
Citation: E. Finkman et al., Polarized front-illumination response in intraband quantum dot infrared photodetectors at 77 K - art. no. 045323, PHYS REV B, 6304(4), 2001, pp. 5323

Authors: Finkman, E Meyer, F Mamor, M
Citation: E. Finkman et al., Short-range order and strain in SiGeC alloys probed by phonons, J APPL PHYS, 89(5), 2001, pp. 2580-2587

Authors: Tisch, U Meyler, B Katz, O Finkman, E Salzman, J
Citation: U. Tisch et al., Dependence of the refractive index of AlxGa1-xN on temperature and composition at elevated temperatures, J APPL PHYS, 89(5), 2001, pp. 2676-2685

Authors: Gusakov, Y Finkman, E Bahir, G Ritter, D
Citation: Y. Gusakov et al., The effect of strain in InP/InGaAs quantum-well infrared photodetectors onthe operating wavelength, APPL PHYS L, 79(16), 2001, pp. 2508-2510

Authors: Sauvage, S Boucaud, P Brunhes, T Immer, V Finkman, E Gerard, JM
Citation: S. Sauvage et al., Midinfrared absorption and photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots, APPL PHYS L, 78(16), 2001, pp. 2327-2329

Authors: Bonan, J Meyer, F Finkman, E Warren, P Boher, P
Citation: J. Bonan et al., Carbon dependence of the dielectric response function in epitaxial SiGeC layers grown on Si, THIN SOL FI, 364(1-2), 2000, pp. 53-57

Authors: Rappaport, N Finkman, E Brunhes, T Boucaud, P Sauvage, S Yam, N Le Thanh, V Bouchier, D
Citation: N. Rappaport et al., Midinfrared photoconductivity of Ge/Si self-assembled quantum dots, APPL PHYS L, 77(20), 2000, pp. 3224-3226
Risultati: 1-8 |