Authors:
Finkman, E
Maimon, S
Immer, V
Bahir, G
Schacham, SE
Fossard, F
Julien, FH
Brault, J
Gendry, M
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Authors:
Tisch, U
Meyler, B
Katz, O
Finkman, E
Salzman, J
Citation: U. Tisch et al., Dependence of the refractive index of AlxGa1-xN on temperature and composition at elevated temperatures, J APPL PHYS, 89(5), 2001, pp. 2676-2685
Citation: Y. Gusakov et al., The effect of strain in InP/InGaAs quantum-well infrared photodetectors onthe operating wavelength, APPL PHYS L, 79(16), 2001, pp. 2508-2510
Authors:
Sauvage, S
Boucaud, P
Brunhes, T
Immer, V
Finkman, E
Gerard, JM
Citation: S. Sauvage et al., Midinfrared absorption and photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots, APPL PHYS L, 78(16), 2001, pp. 2327-2329
Authors:
Bonan, J
Meyer, F
Finkman, E
Warren, P
Boher, P
Citation: J. Bonan et al., Carbon dependence of the dielectric response function in epitaxial SiGeC layers grown on Si, THIN SOL FI, 364(1-2), 2000, pp. 53-57