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Results: 1-19 |
Results: 19
Structure and low- temperature thermal relaxation of ion- implanted germanium
Authors: Glover, CJ Ridgway, MC Yu, KM Foran, GJ Clerc, C Hansen, JL Nylandsted-Larsen, A
Citation: Cj. Glover et al., Structure and low- temperature thermal relaxation of ion- implanted germanium, J SYNCHROTR, 8, 2001, pp. 773-775
X-ray scattering studies of mixed langmuir monolayers and Langmuir-Blodgett films of a noncentrosymmetric porphyrin with cadmium arachidate
Authors: Peng, JB Barnes, GT Gentle, IR Foran, GJ Le, TH Crossley, MJ
Citation: Jb. Peng et al., X-ray scattering studies of mixed langmuir monolayers and Langmuir-Blodgett films of a noncentrosymmetric porphyrin with cadmium arachidate, LANGMUIR, 17(6), 2001, pp. 1936-1940
Implantation-induced disorder in amorphous Ge: Production and relaxation
Authors: Ridgway, MC Glover, CJ Desnica-Frankovic, ID Furic, K Yu, KM Foran, GJ Clerc, C Hansen, JL Larsen, AN
Citation: Mc. Ridgway et al., Implantation-induced disorder in amorphous Ge: Production and relaxation, NUCL INST B, 175, 2001, pp. 21-25
Structural characterisation of amorphised compound semiconductors
Authors: Ridgway, MC Glover, CJ Yu, KM Foran, GJ Lee, TW Moon, Y Yoon, E
Citation: Mc. Ridgway et al., Structural characterisation of amorphised compound semiconductors, NUCL INST B, 175, 2001, pp. 280-285
Structural-relaxation-induced bond length and bond angle changes in amorphized Ge - art. no. 073204
Authors: Glover, CJ Ridgway, MC Yu, KM Foran, GJ Desnica-Frankovic, D Clerc, C Hansen, JL Nylandsted-Larsen, A
Citation: Cj. Glover et al., Structural-relaxation-induced bond length and bond angle changes in amorphized Ge - art. no. 073204, PHYS REV B, 6307(7), 2001, pp. 3204
Determination of the structures of antiinflammatory copper(II) dimers of indomethacin by multiple-scattering analyses of X-ray absorption fine structure data
Authors: Weder, JE Hambley, TW Kennedy, BJ Lay, PA Foran, GJ Rich, AM
Citation: Je. Weder et al., Determination of the structures of antiinflammatory copper(II) dimers of indomethacin by multiple-scattering analyses of X-ray absorption fine structure data, INORG CHEM, 40(6), 2001, pp. 1295-1302
Superstructures and correlated metal ion layers in Langmuir-Blodgett filmsof cadmium soaps observed with crazing incidence X-ray diffraction
Authors: Peng, JB Barnes, GT Gentle, IR Foran, GJ
Citation: Jb. Peng et al., Superstructures and correlated metal ion layers in Langmuir-Blodgett filmsof cadmium soaps observed with crazing incidence X-ray diffraction, J PHYS CH B, 104(23), 2000, pp. 5553-5556
XAFS study of chromated copper arsenate timber preservative in wood
Authors: Bull, DC Harland, PW Vallance, C Foran, GJ
Citation: Dc. Bull et al., XAFS study of chromated copper arsenate timber preservative in wood, J WOOD SCI, 46(3), 2000, pp. 248-252
Structures of mixed Langmuir-Blodgett films of tetrakis(3,5-di-tert-butylphenyl)porphinatocopper(II) with cadmium arachidate: A grazing incidence synchrotron X-ray diffraction study
Authors: Peng, JB Foran, GJ Barnes, GT Crossley, MJ Gentle, IR
Citation: Jb. Peng et al., Structures of mixed Langmuir-Blodgett films of tetrakis(3,5-di-tert-butylphenyl)porphinatocopper(II) with cadmium arachidate: A grazing incidence synchrotron X-ray diffraction study, LANGMUIR, 16(2), 2000, pp. 607-611
X-ray scattering studies of mixed monolayers of Tetrakis(3,5-di-tert-butylphenyl)porphinatocopper(II) cadmium arachidate at the air/water interface
Authors: Peng, JB Lawrie, GA Barnes, GT Gentle, IR Foran, GJ Crossley, MJ Huang, ZQ
Citation: Jb. Peng et al., X-ray scattering studies of mixed monolayers of Tetrakis(3,5-di-tert-butylphenyl)porphinatocopper(II) cadmium arachidate at the air/water interface, LANGMUIR, 16(17), 2000, pp. 7051-7055
Micro- and macro-structure of implantation-induced disorder in Ge
Authors: Glover, CJ Ridgway, MC Byrne, AP Yu, KM Foran, GJ Clerc, C Hansen, JL Larsen, AN
Citation: Cj. Glover et al., Micro- and macro-structure of implantation-induced disorder in Ge, NUCL INST B, 161, 2000, pp. 1033-1037
Ion-dose-dependent microstructure in amorphous Ge
Authors: Ridgway, MC Glover, CJ Yu, KM Foran, GJ Clerc, C Hansen, JL Larsen, AN
Citation: Mc. Ridgway et al., Ion-dose-dependent microstructure in amorphous Ge, PHYS REV B, 61(19), 2000, pp. 12586-12589
Characterisation of ion-implantation-induced disorder in GaAs by EXAFS
Authors: Glover, CJ Yu, KM Ridgway, MC Foran, GJ
Citation: Cj. Glover et al., Characterisation of ion-implantation-induced disorder in GaAs by EXAFS, JPN J A P 1, 38, 1999, pp. 548-551
X-ray absorption spectroscopic studies of the Cr(IV) 2-ethyl-2-hydroxybutanoato(1-) complex
Authors: Levina, A Foran, GJ Lay, PA
Citation: A. Levina et al., X-ray absorption spectroscopic studies of the Cr(IV) 2-ethyl-2-hydroxybutanoato(1-) complex, CHEM COMMUN, (23), 1999, pp. 2339-2340
Observation of hexagonal crystalline diffraction from growing silicate films
Authors: Holt, SA Foran, GJ White, JW
Citation: Sa. Holt et al., Observation of hexagonal crystalline diffraction from growing silicate films, LANGMUIR, 15(7), 1999, pp. 2540-2542
Atomic-level characterisation of ion-induced amorphisation in compound semiconductors
Authors: Ridgway, MC Glover, CJ Bezakova, E Byrne, AP Foran, GJ Yu, KM
Citation: Mc. Ridgway et al., Atomic-level characterisation of ion-induced amorphisation in compound semiconductors, NUCL INST B, 148(1-4), 1999, pp. 391-395
Atomic-level characterisation of the structure of amorphised GaAs utilising EXAFS measurements
Authors: Ridgway, MC Glover, CJ Foran, GJ Yu, KM
Citation: Mc. Ridgway et al., Atomic-level characterisation of the structure of amorphised GaAs utilising EXAFS measurements, NUCL INST B, 147(1-4), 1999, pp. 148-154
Composition-dependent bond lengths in crystalline and amorphized GexSi1-x alloys
Authors: Ridgway, MC Yu, KM Glover, CJ Foran, GJ Clerc, C Hansen, JL Larsen, AN
Citation: Mc. Ridgway et al., Composition-dependent bond lengths in crystalline and amorphized GexSi1-x alloys, PHYS REV B, 60(15), 1999, pp. 10831-10836
Structural characterization of amorphized InP: Evidence for chemical disorder
Authors: Glover, CJ Ridgway, MC Yu, KM Foran, GJ Lee, TW Moon, Y Yoon, E
Citation: Cj. Glover et al., Structural characterization of amorphized InP: Evidence for chemical disorder, APPL PHYS L, 74(12), 1999, pp. 1713-1715
Risultati: 1-19 |