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Results: 1-9 |
Results: 9

Authors: Foster, AS Hofer, WA Shluger, AL
Citation: As. Foster et al., Quantitative modelling in scanning probe microscopy, CURR OP SOL, 5(5), 2001, pp. 427-434

Authors: Barth, C Foster, AS Reichling, M Shluger, AL
Citation: C. Barth et al., Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory, J PHYS-COND, 13(10), 2001, pp. 2061-2079

Authors: Foster, AS Shluger, AL
Citation: As. Foster et Al. Shluger, Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface, SURF SCI, 490(1-2), 2001, pp. 211-219

Authors: Foster, AS Barth, C Shluger, AL Reichling, M
Citation: As. Foster et al., Unambiguous interpretation of atomically resolved force microscopy images of an insulator, PHYS REV L, 86(11), 2001, pp. 2373-2376

Authors: Bennewitz, R Foster, AS Kantorovich, LN Bammerlin, M Loppacher, C Schar, S Guggisberg, M Meyer, E Shluger, AL
Citation: R. Bennewitz et al., Atomically resolved edges and kinks of NaCl islands on Cu(111): Experimentand theory, PHYS REV B, 62(3), 2000, pp. 2074-2084

Authors: Kantorovich, LN Foster, AS Shluger, AL Stoneham, AM
Citation: Ln. Kantorovich et al., Role of image forces in non-contact scanning force microscope images of ionic surfaces, SURF SCI, 445(2-3), 2000, pp. 283-299

Authors: Shluger, AL Livshits, AI Foster, AS Catlow, CRA
Citation: Al. Shluger et al., Models of image contrast in scanning force microscopy on insulators, J PHYS-COND, 11(26), 1999, pp. R295-R322

Authors: Sushko, PV Foster, AS Kantorovich, LN Shluger, AL
Citation: Pv. Sushko et al., Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM), APPL SURF S, 145, 1999, pp. 608-612

Authors: Livshits, AI Shluger, AL Rohl, AL Foster, AS
Citation: Ai. Livshits et al., Model of noncontact scanning force microscopy on ionic surfaces, PHYS REV B, 59(3), 1999, pp. 2436-2448
Risultati: 1-9 |