Authors:
Barth, C
Foster, AS
Reichling, M
Shluger, AL
Citation: C. Barth et al., Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory, J PHYS-COND, 13(10), 2001, pp. 2061-2079
Citation: As. Foster et Al. Shluger, Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface, SURF SCI, 490(1-2), 2001, pp. 211-219
Authors:
Foster, AS
Barth, C
Shluger, AL
Reichling, M
Citation: As. Foster et al., Unambiguous interpretation of atomically resolved force microscopy images of an insulator, PHYS REV L, 86(11), 2001, pp. 2373-2376
Authors:
Bennewitz, R
Foster, AS
Kantorovich, LN
Bammerlin, M
Loppacher, C
Schar, S
Guggisberg, M
Meyer, E
Shluger, AL
Citation: R. Bennewitz et al., Atomically resolved edges and kinks of NaCl islands on Cu(111): Experimentand theory, PHYS REV B, 62(3), 2000, pp. 2074-2084
Authors:
Kantorovich, LN
Foster, AS
Shluger, AL
Stoneham, AM
Citation: Ln. Kantorovich et al., Role of image forces in non-contact scanning force microscope images of ionic surfaces, SURF SCI, 445(2-3), 2000, pp. 283-299
Authors:
Sushko, PV
Foster, AS
Kantorovich, LN
Shluger, AL
Citation: Pv. Sushko et al., Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM), APPL SURF S, 145, 1999, pp. 608-612