Citation: Lb. Freund et Ht. Johnson, Influence of strain on functional characteristics of nanoelectronic devices, J MECH PHYS, 49(9), 2001, pp. 1925-1935
Citation: Lb. Freund et E. Chason, Model for stress generated upon contact of neighboring islands on the surface of a substrate, J APPL PHYS, 89(9), 2001, pp. 4866-4873
Citation: H. Lee et al., Full-field optical measurement of curvatures in ultra-thin-film-substrate systems in the range of geometrically nonlinear deformations, J APPL PHYS, 89(11), 2001, pp. 6116-6129
Citation: Ht. Johnson et Lb. Freund, The influence of strain on confined electronic states in semiconductor quantum structures, INT J SOL S, 38(6-7), 2001, pp. 1045-1062
Authors:
Liu, J
Zaslavsky, A
Akyuz, CD
Perkins, BR
Freund, LB
Citation: J. Liu et al., Magnetotunneling spectroscopic probe of quantization due to inhomogeneous strain in a Si/SiGe vertical quantum dot, PHYS REV B, 62(12), 2000, pp. R7731-R7734
Citation: Lb. Freund, Substrate curvature due to thin film mismatch strain in the nonlinear deformation range, J MECH PHYS, 48(6-7), 2000, pp. 1159-1174
Citation: Nj. Sorensen et Lb. Freund, Unstable neck formation in a ductile ring subjected to impulsive radial loading, INT J SOL S, 37(16), 2000, pp. 2265-2283
Authors:
Gao, H
Ozkan, CS
Nix, WD
Zimmerman, JA
Freund, LB
Citation: H. Gao et al., Atomistic models of dislocation formation at crystal surface ledges in Si1-xGex/Si(100) heteroepitaxial thin films, PHIL MAG A, 79(2), 1999, pp. 349-370
Citation: Lb. Freund et al., Extensions of the Stoney formula for substrate curvature to configurationswith thin substrates or large deformations, APPL PHYS L, 74(14), 1999, pp. 1987-1989