Authors:
Vaz, CAF
Lauhoff, G
Bland, JAC
Fulthorpe, BD
Hase, TPA
Tanner, BK
Langridge, S
Penfold, J
Citation: Caf. Vaz et al., Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films, J MAGN MAGN, 226, 2001, pp. 1618-1620
Citation: Tpa. Hase et al., Soft X-ray magnetic scattering study of rotational magnetisation processesin cobalt/copper multilayers, J MAGN MAGN, 226, 2001, pp. 1717-1719
Authors:
Luo, GM
Mai, ZH
Hase, TPA
Fulthorpe, BD
Tanner, BK
Marrows, CH
Hickey, BJ
Citation: Gm. Luo et al., X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers, J MAGN MAGN, 226, 2001, pp. 1728-1729
Authors:
Fulthorpe, BD
Ryan, PA
Hase, TPA
Tanner, BK
Hickey, BJ
Citation: Bd. Fulthorpe et al., High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers, J PHYS D, 34(10A), 2001, pp. A203-A207
Authors:
Fulthorpe, BD
Joyce, DE
Hase, TPA
Rozatian, ASH
Tanner, BK
Grundy, PJ
Citation: Bd. Fulthorpe et al., The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films, J PHYS-COND, 11(43), 1999, pp. 8477-8487