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Results:
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Results: 17
Authors:
SCHOFIELD MA
AITA CR
RICE PM
GAJDARDZISKAJOSIFOVSKA M
Citation: Ma. Schofield et al., TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ZIRCONIA-ALUMINA NANOLAMINATES GROWN BY REACTIVE SPUTTER-DEPOSITION - PART I - ZIRCONIA NANOCRYSTALLITE GROWTH-MORPHOLOGY, Thin solid films, 326(1-2), 1998, pp. 106-116
Authors:
SCHOFIELD MA
AITA CR
RICE PM
GAJDARDZISKAJOSIFOVSKA M
Citation: Ma. Schofield et al., TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ZIRCONIA-ALUMINA NANOLAMINATES GROWN BY REACTIVE SPUTTER-DEPOSITION - PART II - TRANSFORMATION BEHAVIOR OF TETRAGONAL ZIRCONIA NANOCRYSTALLITES, Thin solid films, 326(1-2), 1998, pp. 117-125
Authors:
PLASS R
FELLER J
GAJDARDZISKAJOSIFOVSKA M
Citation: R. Plass et al., MORPHOLOGY OF MGO(111) SURFACES - ARTIFACTS ASSOCIATED WITH THE FACETING OF POLAR OXIDE SURFACES INTO NEUTRAL SURFACES, Surface science, 414(1-2), 1998, pp. 26-37
Authors:
PLASS R
EGAN K
COLLAZODAVILA C
GROZEA D
LANDREE E
MARKS LD
GAJDARDZISKAJOSIFOVSKA M
Citation: R. Plass et al., CYCLIC OZONE IDENTIFIED IN MAGNESIUM-OXIDE (111) SURFACE RECONSTRUCTIONS, Physical review letters, 81(22), 1998, pp. 4891-4894
Authors:
GAJDARDZISKAJOSIFOVSKA M
MALAY MH
SMITH DJ
Citation: M. Gajdardziskajosifovska et al., REFLECTION ELECTRON-MICROSCOPY METHODOLOGY FOR QUANTIFICATION OF CLUSTER GROWTH - INDIUM CLUSTERS ON THE INP(110) SURFACE, Surface review and letters, 4(4), 1997, pp. 655-669
Authors:
GAJDARDZISKAJOSIFOVSKA M
AITA CR
Citation: M. Gajdardziskajosifovska et Cr. Aita, THE TRANSFORMATION STRUCTURE OF ZIRCONIA-ALUMINA NANOLAMINATES STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY, Journal of applied physics, 79(3), 1996, pp. 1315-1319
Authors:
AITA CR
WIGGINS MD
WHIG R
SCANLAN CM
GAJDARDZISKAJOSIFOVSKA M
Citation: Cr. Aita et al., THERMODYNAMICS OF TETRAGONAL ZIRCONIA FORMATION IN A NANOLAMINATE FILM, Journal of applied physics, 79(2), 1996, pp. 1176-1178
Authors:
GAJDARDZISKAJOSIFOVSKA M
WEISS JK
COWLEY JM
Citation: M. Gajdardziskajosifovska et al., STUDIES OF MO SI MULTILAYERS WITH COHERENT ELECTRON-BEAMS/, Ultramicroscopy, 58(1), 1995, pp. 65-78
Authors:
HUANG Y
GAJDARDZISKAJOSIFOVSKA M
COWLEY JM
Citation: Y. Huang et al., REM IN A UHV TEM FOR THE OBSERVATION OF DYNAMIC PHASE-TRANSFORMATION PROCESSES ON THE CU3AU(111) SURFACE, Ultramicroscopy, 57(4), 1995, pp. 391-408
Authors:
GAJDARDZISKAJOSIFOVSKA M
SALDIN D
Citation: M. Gajdardziskajosifovska et D. Saldin, UNTITLED - PREFACE, Surface review and letters, 2(1), 1995, pp. 3-4
Authors:
GAJDARDZISKAJOSIFOVSKA M
MALAY MH
SMITH DJ
Citation: M. Gajdardziskajosifovska et al., DYNAMIC PROCESSES AT INP(110) SURFACES STUDIED BY UHV REFLECTION ELECTRON-MICROSCOPY, Surface science, 340(1-2), 1995, pp. 141-152
Authors:
AITA CR
SCANLAN CM
GAJDARDZISKAJOSIFOVSKA M
Citation: Cr. Aita et al., SPUTTER-DEPOSITED ZIRCONIA-ALUMINA NANOLAMINATE COATINGS, JOM, 46(10), 1994, pp. 40-42
Authors:
MCCARTNEY MR
GAJDARDZISKAJOSIFOVSKA M
Citation: Mr. Mccartney et M. Gajdardziskajosifovska, ABSOLUTE MEASUREMENT OF NORMALIZED THICKNESS, T LAMBDA(I), FROM OFF-AXIS ELECTRON HOLOGRAPHY/, Ultramicroscopy, 53(3), 1994, pp. 283-289
Authors:
GAJDARDZISKAJOSIFOVSKA M
MCCARTNEY MR
Citation: M. Gajdardziskajosifovska et Mr. Mccartney, ELIMINATION OF THICKNESS DEPENDENCE FROM MEDIUM RESOLUTION ELECTRON HOLOGRAMS, Ultramicroscopy, 53(3), 1994, pp. 291-296
Authors:
SCANLAN CM
GAJDARDZISKAJOSIFOVSKA M
AITA CR
Citation: Cm. Scanlan et al., TETRAGONAL ZIRCONIA GROWTH BY NANOLAMINATE FORMATION, Applied physics letters, 64(26), 1994, pp. 3548-3550
Authors:
GAJDARDZISKAJOSIFOVSKA M
MCCARTNEY MR
DERUIJTER WJ
SMITH DJ
WEISS JK
ZUO JM
Citation: M. Gajdardziskajosifovska et al., ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS, Ultramicroscopy, 50(3), 1993, pp. 285-299
Authors:
WEISS JK
DERUIJTER WJ
GAJDARDZISKAJOSIFOVSKA M
MCCARTNEY MR
SMITH DJ
Citation: Jk. Weiss et al., APPLICATIONS OF ELECTRON HOLOGRAPHY TO THE STUDY OF INTERFACES, Ultramicroscopy, 50(3), 1993, pp. 301-311
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