Citation: J. Goschnick et M. Sommer, RAPID SOIL ANALYSES OF OVERBURDEN MATERIAL FROM HISTORIC MINES WITH SNMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 704-707
Citation: J. Goschnick et al., THE DEPTH DISTRIBUTION OF ORGANIC ADDITIVES IN MORTAR MEASURED WITH PLASMA-BASED SECONDARY NEUTRAL MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 707-709
Citation: J. Goschnick et al., NONUNIFORM SIO2 MEMBRANES PRODUCED BY ION-BEAM-ASSISTED CHEMICAL-VAPOR-DEPOSITION TO TUNE WO3 GAS SENSOR MICROARRAYS, Surface & coatings technology, 109(1-3), 1998, pp. 292-296
Citation: J. Goschnick et al., DEPTH PROFILING OF NONCONDUCTIVE OXIDIC MULTILAYERS WITH PLASMA-BASEDSNMS IN HF-MODE, Thin solid films, 332(1-2), 1998, pp. 215-219
Citation: F. Faude et J. Goschnick, XPS, SIMS AND SNMS APPLIED TO A COMBINED ANALYSIS OF AEROSOL-PARTICLES FROM A REGION OF CONSIDERABLE AIR-POLLUTION IN THE UPPER RHINE VALLEY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 67-72
Citation: J. Goschnick et al., PROGRESS IN THE ACCURACY ENHANCEMENT FOR ELEMENTAL ANALYSIS BY QUADRUPOLE-BASED PLASMA-SNMS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 159-162
Citation: J. Goschnick et al., ACCURACY OF THE ELEMENTAL QUANTIFICATION WITH PLASMA-BASED SNMS FOR COMPLEX ENVIRONMENTAL MATERIAL, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 548-551
Citation: Jwg. Bentz et al., DEPTH-RESOLVED INVESTIGATION OF THE ELEMENT AND COMPOUND INVENTORY OFAEROSOL-PARTICLES FROM OUTDOOR AIR, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 559-564
Authors:
GOSCHNICK J
FICHTNER M
SCHNEIDER T
ACHE HJ
Citation: J. Goschnick et al., RAPID-DETERMINATION OF EROSION RATES WITH ELECTRON-BEAM SNMS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 598-602
Citation: Jwg. Bentz et al., ANALYSIS AND CLASSIFICATION OF INDIVIDUAL OUTDOOR AEROSOL-PARTICLES WITH SIMS TIME-OF-FLIGHT MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 603-608
Authors:
ALTHAINZ P
DAHLKE A
FRIETSCHKLARHOF M
GOSCHNICK J
ACHE HJ
Citation: P. Althainz et al., RECEPTION TUNING OF GAS-SENSOR MICROSYSTEMS BY SELECTIVE COATINGS, Sensors and actuators. B, Chemical, 25(1-3), 1995, pp. 366-369
Citation: P. Althainz et al., THE INFLUENCE OF MORPHOLOGY ON THE RESPONSE OF IRON-OXIDE GAS SENSORS, Sensors and actuators. B, Chemical, 25(1-3), 1995, pp. 448-450
Citation: J. Goschnick et al., DEPTH-STRUCTURE OF AIRBORNE MICROPARTICLES SAMPLED DOWNWIND FROM THE CITY OF KARLSRUHE IN THE RIVER RHINE VALLEY, Fresenius' journal of analytical chemistry, 350(7-9), 1994, pp. 426-430
Citation: J. Goschnick et al., CALIBRATION OF DEPTH PROFILES OF MICROPARTICLES MEASURED WITH PLASMA-BASED SECONDARY NEUTRAL MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 203-205
Citation: Jwg. Bentz et al., DEPTH-RESOLVED SPECIATION OF NITROGEN-COMPOUNDS IN ENVIRONMENTAL SOLIDS, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 205-207
Citation: M. Fichtner et al., IDENTIFICATION OF NITRATES AND SULFATES WITH DYNAMIC SIMS, Fresenius' journal of analytical chemistry, 348(3), 1994, pp. 201-204
Authors:
ACHE HF
GOSCHNICK J
SOMMER M
EMIG G
SCHOCH G
WORMER O
Citation: Hf. Ache et al., CHEMICAL-VAPOR-DEPOSITION OF HAFNIUM CARBIDE AND CHARACTERIZATION OF THE DEPOSITED LAYERS BY SECONDARY-NEUTRAL MASS-SPECTROMETRY, Thin solid films, 241(1-2), 1994, pp. 356-360
Citation: P. Althainz et al., GRANULAR FILMS OF IRON-OXIDE PREPARED BY AEROSOL DEPOSITION FOR THE DETECTION OF ORGANIC VAPORS, Thin solid films, 241(1-2), 1994, pp. 366-369
Authors:
ALTHAINZ P
DAHLKE A
FRIETSCHKLARHOF M
GOSCHNICK J
ACHE HJ
Citation: P. Althainz et al., ORGANICALLY MODIFIED SIO2 AND AL2O3 FILMS AS SELECTIVE COMPONENTS FORGAS SENSORS, Physica status solidi. a, Applied research, 145(2), 1994, pp. 611-618
Authors:
BENTZ JWG
EWINGER HP
GOSCHNICK J
KANNEN G
ACHE HJ
Citation: Jwg. Bentz et al., DEPTH-PROFILING OF ORGANIC LAYERS ON MICROPARTICLES WITH SNMS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 123-127
Authors:
BARTELLA J
FUCHS R
GOSCHNICK J
GRUNENBERG D
Citation: J. Bartella et al., ROUND-ROBIN STUDY OF THE INA-3 USERS FORUM - TECHNICAL AL AND STEEL SAMPLES, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 131-133
Citation: J. Goschnick et al., DEPTH-PROFILES WITHIN GLASS SAMPLES FROM ANODIC BONDING EXPERIMENTS WITH COPPER USING SNMS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 323-326
Citation: J. Goschnick et al., HETEROELEMENTAL DIATOMIC SECONDARY IONS AS A PROBE FOR MOLECULAR-STATES, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 365-367