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Citation: D. Graf et al., CHARACTERIZATION OF CRYSTAL QUALITY BY CRYSTAL ORIGINATED PARTICLE DELINEATION AND THE IMPACT ON THE SILICON-WAFER SURFACE, Journal of the Electrochemical Society, 145(1), 1998, pp. 275-284
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MORGENSTERN G
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Citation: G. Kissinger et al., INTERNAL OXIDATION OF VACANCY AGGLOMERATES IN CZOCHRALSKI SILICON-WAFERS DURING HIGH-TEMPERATURE ANNEALS, Applied physics letters, 72(2), 1998, pp. 223-225
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GRAF D
LAMBERT U
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Citation: G. Kissinger et al., KEY INFLUENCE OF THE THERMAL HISTORY ON PROCESS-INDUCED DEFECTS IN CZOCHRALSKI SILICON-WAFERS, Semiconductor science and technology, 12(7), 1997, pp. 933-937
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KISSINGER G
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LAMBERT U
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AIRO P
GRAF D
MARCONI M
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MALACARNE F
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Citation: D. Brugnoni et al., ONTOGENY OF CD40L EXPRESSION BY ACTIVATED PERIPHERAL-BLOOD LYMPHOCYTES IN HUMANS (VOL 49, PG 27, 1996), Immunology letters, 52(1), 1996, pp. 61-61
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GRAF D
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MALACARNE F
SORESINA A
UGAZIO AG
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Citation: D. Brugnoni et al., ONTOGENY OF CD40 EXPRESSION BY ACTIVATED PERIPHERAL-BLOOD LYMPHOCYTESIN HUMANS, Immunology letters, 49(1-2), 1996, pp. 27-30
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CACERES EM
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GRAF D
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HENN V
SCHRODER JM
GRAF D
KROCZEK RA
Citation: B. Ludewig et al., INDUCTION, REGULATION, AND FUNCTION OF SOLUBLE TRAP (CD40 LIGAND) DURING INTERACTION OF PRIMARY CD4(-CELLS WITH DENDRITIC CELLS() CD45RA(+)T), European Journal of Immunology, 26(12), 1996, pp. 3137-3143
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GRAF D
GELDERBLOM HR
BECKER Y
KROCZEK RA
PAULI G
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MULLER S
KORTHAUER U
VANKOOTEN C
WEISE C
KROCZEK RA
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LAMBERT U
BROHL M
EHLERT A
WAHLICH R
WAGNER P
Citation: D. Graf et al., IMPROVEMENT OF CZOCHRALSKI SILICON-WAFERS BY HIGH-TEMPERATURE ANNEALING, Journal of the Electrochemical Society, 142(9), 1995, pp. 3189-3192