Authors: GRIESSER M HUTTER H GRASSERBAUER M KALSS W HAUBNER R LUX B

Citation: M. Griesser et al., SIMS-ANALYSIS ON B, N, AND C CONTAINING LAYERS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 293-296

Authors: LUX B HAUBNER R GRIESSER M GRASSERBAUER M

Citation: B. Lux et al., SUPERHARD COATINGS - PRODUCTION AND ANALYSIS, Mikrochimica acta, 125(1-4), 1997, pp. 197-209

Authors: SPICKA H GRIESSER M HUTTER H GRASSERBAUER M BOHR S HAUBNER R LUX B

Citation: H. Spicka et al., INVESTIGATIONS OF THE INCORPORATION OF B, P AND N INTO CVD-DIAMOND FILMS BY SECONDARY-ION MASS-SPECTROMETRY, DIAMOND AND RELATED MATERIALS, 5(3-5), 1996, pp. 383-387

Authors: HAUBNER R KUBELKA S LUX B GRIESSER M GRASSERBAUER M

Citation: R. Haubner et al., MURAKAMI AND H2SO4 H2O2 PRETREATMENT OF WC-CO HARD METAL SUBSTRATES TO INCREASE THE ADHESION OF CVD DIAMOND COATINGS/, Journal de physique. IV, 5(C5), 1995, pp. 753-760

Authors: GRIESSER M GRASSERBAUER M KELLNER R BOHR S HAUBNER R LUX B

Citation: M. Griesser et al., NIR-RAMAN AND VIS-RAMAN SPECTROSCOPY OF CVD DIAMOND FILMS, Fresenius' journal of analytical chemistry, 352(7-8), 1995, pp. 763-770

Authors: GRIESSER M STINGEDER G GRASSERBAUER M BAUMANN H LINK F WURZINGER P LUX H HAUBNER R LUX B

Citation: M. Griesser et al., CHARACTERIZATION OF TANTALUM IMPURITIES IN HOT-FILAMENT DIAMOND LAYERS, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 638-644