Citation: Ga. Gusakov et al., TEMPERATURE-DEPENDENCE OF THE CRITICAL DOSE OF DEFECTS FOR THE TRANSITION OF SILICON TO THE AMORPHOUS STATE AS A RESULT OF ION-IMPLANTATION, Semiconductors, 28(9), 1994, pp. 931-934
Authors:
AKIMOV AN
VLASUKOVA LA
GUSAKOV GA
KOMAROV FF
KUTAS AA
NOVIKOV AP
Citation: An. Akimov et al., ION-INDUCED ANNEALING OF DAMAGE IN GAAS IMPLANTED WITH ARGON IONS, Radiation effects and defects in solids, 129(3-4), 1994, pp. 147-154