Authors:
Gaganidze, E
Schwab, R
Halbritter, J
Heidinger, R
Aidam, R
Schneider, R
Citation: E. Gaganidze et al., Power handling capabilities of Y-Ba-Cu-O wafers and patterned microstrip resonators, IEEE APPL S, 11(1), 2001, pp. 2808-2811
Authors:
Geerk, J
Zaitsev, A
Linker, G
Aidam, R
Schneider, R
Ratzel, F
Fromknecht, R
Scheerer, B
Reiner, H
Gaganidze, E
Schwab, R
Citation: J. Geerk et al., A 3-chamber deposition system for the simultaneous double-sided coating of5-inch wafers, IEEE APPL S, 11(1), 2001, pp. 3856-3858
Authors:
Schwab, R
Gaganidze, E
Halbritter, J
Heidinger, R
Aidam, R
Schneider, R
Citation: R. Schwab et al., YBCO wafer qualification by surface resistance measurements combined with performance studies of microstrip resonators, PHYSICA C, 351(1), 2001, pp. 25-28
Authors:
Ramos, MA
Konig, R
Gaganidze, E
Esquinazi, P
Citation: Ma. Ramos et al., Acoustic properties of amorphous metals at very low temperatures: Applicability of the tunneling model, PHYS REV B, 61(2), 2000, pp. 1059-1067