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Results:
1-15
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Results: 15
Authors:
Gerardi, C
Giannini, C
De Caro, L
Tapfer, L
Rouillard, Y
Jenichen, B
Daweritz, L
Ploog, KH
Citation: C. Gerardi et al., Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb-AlGaSb heterostructures grown by molecular beam epitaxy, J VAC SCI B, 19(3), 2001, pp. 836-842
Authors:
Crupi, I
Lombardo, S
Spinella, C
Gerardi, C
Fazio, B
Vulpio, M
Melanotte, M
Liao, YG
Bongiorno, C
Citation: I. Crupi et al., Memory effects in MOS capacitors with silicon quantum dots, MAT SCI E C, 15(1-2), 2001, pp. 283-285
Authors:
Gerardi, C
Blando, F
Santino, A
Zacheo, G
Citation: C. Gerardi et al., Purification and characterisation of a beta-glucosidase abundantly expressed in ripe sweet cherry (Prunus avium L.) fruit, PLANT SCI, 160(5), 2001, pp. 795-805
Authors:
Hadley, PC
Milella, E
Gerardi, C
Hill, RG
Billington, RW
Citation: Pc. Hadley et al., Distribution of fluoride in glass ionomer cement determined using SIMS, BIOMATERIAL, 22(12), 2001, pp. 1563-1569
Authors:
Crupi, I
Lombardo, S
Spinella, C
Bongiorno, C
Liao, Y
Gerardi, C
Fazio, B
Vulpio, M
Privitera, S
Citation: I. Crupi et al., Electrical and structural characterization of metal-oxide-semiconductor capacitors with silicon rich oxide, J APPL PHYS, 89(10), 2001, pp. 5552-5558
Authors:
Lombardo, S
La Magna, A
Crupi, I
Gerardi, C
Crupi, F
Citation: S. Lombardo et al., Reduction of thermal damage in ultrathin gate oxides after intrinsic dielectric breakdown, APPL PHYS L, 79(10), 2001, pp. 1522-1524
Authors:
Gerardi, C
Melanotte, M
Crivelli, B
Zonca, R
Alessandri, M
Citation: C. Gerardi et al., Nitridation of gate and tunnel oxides employed in CMOS-ULSI technology, MICRON, 31(3), 2000, pp. 291-297
Authors:
Lombardo, S
Coffa, S
Bongiorno, C
Spinella, C
Castagna, E
Sciuto, A
Gerardi, C
Ferrari, F
Fazio, B
Privitera, S
Citation: S. Lombardo et al., Correlation of dot size distribution with luminescence and electrical transport of Si quantum dots embedded in SiO2, MAT SCI E B, 69, 2000, pp. 295-298
Authors:
Gerardi, C
Tagliente, MA
Del Vecchio, A
Tapfer, L
Coccorese, C
Attanasio, C
Mercaldo, LV
Maritato, L
Slaughter, JM
Falco, CM
Citation: C. Gerardi et al., Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers, J APPL PHYS, 87(2), 2000, pp. 717-723
Authors:
Gerardi, C
Melanotte, M
Lombardo, S
Alessandri, M
Crivelli, B
Zonca, R
Citation: C. Gerardi et al., Effects of nitridation by nitric oxide on the leakage current of thin SiO2gate oxides, J APPL PHYS, 87(1), 2000, pp. 498-501
Authors:
Walden, PD
Gerardi, C
Lepor, H
Citation: Pd. Walden et al., Localization and expression of the alpha(1A-1), alpha(1B) and alpha(1D)-adrenoceptors in hyperplastic and non-hyperplastic human prostate, J UROL, 161(2), 1999, pp. 635-640
Authors:
Rouillard, Y
Jenichen, B
Daweritz, L
Ploog, K
Gerardi, C
Giannini, C
De Caro, L
Tapfer, L
Citation: Y. Rouillard et al., MBE growth and characterisation of Al(x)Ga(1-x)Sblayers on GaSb substrates, J CRYST GR, 204(3), 1999, pp. 263-269
Authors:
Lombardo, S
La Magna, A
Spinella, C
Gerardi, C
Crupi, F
Citation: S. Lombardo et al., Degradation and hard breakdown transient of thin gate oxides in metal-SiO2-Si capacitors: Dependence on oxide thickness, J APPL PHYS, 86(11), 1999, pp. 6382-6391
Authors:
Gerardi, C
Zonca, R
Crivelli, B
Alessandri, M
Citation: C. Gerardi et al., Nitridation of thin gate or tunnel oxides by nitric oxide, J ELCHEM SO, 146(8), 1999, pp. 3058-3064
Authors:
Lombardo, S
La Magna, A
Gerardi, C
Alessandri, M
Crupi, F
Citation: S. Lombardo et al., Soft breakdown of gate oxides in metal-SiO2-Si capacitors under stress with hot electrons, APPL PHYS L, 75(8), 1999, pp. 1161-1163
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