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Results:
1-11
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Results: 11
Authors:
Lomness, JK
Giannuzzi, LA
Hampton, MD
Citation: Jk. Lomness et al., Site-specific transmission electron microscope characterization of micrometer-sized particles using the focused ion beam lift-out technique, MICROS MICR, 7(5), 2001, pp. 418-423
Authors:
Kempshall, BW
Schwarz, SM
Prenitzer, BI
Giannuzzi, LA
Irwin, RB
Stevie, FA
Citation: Bw. Kempshall et al., Ion channeling effects on the focused ion beam milling of Cu, J VAC SCI B, 19(3), 2001, pp. 749-754
Electrical linewidth test structures patterned in (100) silicon-on-insulator for use as CD standards
Authors:
Cresswell, MW
Bonevich, JE
Allen, RA
Guillaume, NMP
Giannuzzi, LA
Everist, SC
Murabito, CE
Shea, PJ
Linholm, LW
Citation: Mw. Cresswell et al., Electrical linewidth test structures patterned in (100) silicon-on-insulator for use as CD standards, IEEE SEMIC, 14(4), 2001, pp. 356-364
Authors:
Stevie, FA
Vartuli, CB
Giannuzzi, LA
Shofner, TL
Brown, SR
Rossie, B
Hillion, F
Mills, RH
Antonell, M
Irwin, RB
Purcell, BM
Citation: Fa. Stevie et al., Application of focused ion beam lift-out specimen preparation to TEM, SEM,STEM, AES and SIMS analysis, SURF INT AN, 31(5), 2001, pp. 345-351
Authors:
White, H
Pu, Y
Rafailovich, M
Sokolov, J
King, AH
Giannuzzi, LA
Urbanik-Shannon, C
Kempshall, BW
Eisenberg, A
Schwarz, SA
Strzhemeckny, YM
Citation: H. White et al., Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates, POLYMER, 42(4), 2001, pp. 1613-1619
Authors:
Schwarz, SM
Houge, EC
Giannuzzi, LA
King, AH
Citation: Sm. Schwarz et al., Bicrystal growth and characterization of copper twist grain boundaries, J CRYST GR, 222(1-2), 2001, pp. 392-398
Authors:
Heaney, PJ
Vicenzi, EP
Giannuzzi, LA
Livi, KJT
Citation: Pj. Heaney et al., Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials, AM MINERAL, 86(9), 2001, pp. 1094-1099
Authors:
Giannuzzi, LA
Stevie, FA
Citation: La. Giannuzzi et Fa. Stevie, A review of focused ion beam milling techniques for TEM specimen preparation, MICRON, 30(3), 1999, pp. 197-204
Authors:
Readinger, ED
Wolter, SD
Waltemyer, DL
Delucca, JM
Mohney, SE
Prenitzer, BI
Giannuzzi, LA
Molnar, RJ
Citation: Ed. Readinger et al., Wet thermal oxidation of GaN, J ELEC MAT, 28(3), 1999, pp. 257-260
Authors:
Lewinsohn, CA
Giannuzzi, LA
Bakis, CE
Tressler, RE
Citation: Ca. Lewinsohn et al., High-temperature creep and microstructural evolution of chemically vapor-deposited silicon carbide fibers, J AM CERAM, 82(2), 1999, pp. 407-413
Authors:
Lewinsohn, CA
Giannuzzi, LA
Bakis, CE
Tressler, RE
Citation: Ca. Lewinsohn et al., High-temperature creep and microstructural evolution of chemically vapor-deposited silicon carbide fibers (vol 82, pg 407, 1999), J AM CERAM, 82(11), 1999, pp. 3272-3272
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