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Citation: H. Wolf et al., Analyzing the switching behavior of ESD-protection transistors by very fast transmission line pulsing, J ELECTROST, 49(3-4), 2000, pp. 111-127

Authors: Bonfert, D Gieser, H

Citation: D. Bonfert et H. Gieser, Transient induced latch-up triggered by very fast pulses, MICROEL REL, 39(6-7), 1999, pp. 875-878

Authors: Chaine, M Verhaege, K Avery, L Kelly, M Gieser, H Bock, K Henry, LG Meuse, T Brodbeck, T Barth, J

Citation: M. Chaine et al., Investigation into socketed CDM (SDM) tester parasitics, MICROEL REL, 39(11), 1999, pp. 1531-1540

Authors: Wolf, H Gieser, H Stadler, W

Citation: H. Wolf et al., Bipolar model extension for MOS transistors considering gate coupling effects in the HEM ESD domain, MICROEL REL, 39(11), 1999, pp. 1541-1549

Authors: Stricker, AD Mettler, S Wolf, H Mergens, M Wilkening, W Gieser, H Fichtner, W

Citation: Ad. Stricker et al., Characterization and optimization of a bipolar ESD-device by measurements and simulations, MICROEL REL, 39(11), 1999, pp. 1563-1577

Authors: Stadler, W Guggenmos, X Egger, P Gieser, H Musshoff, C

Citation: W. Stadler et al., Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?, MICROEL REL, 38(11), 1998, pp. 1773-1780