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Results: 1-14 |
Results: 14
Quantitative XPS I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Quantitative XPS I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database, J ELEC SPEC, 120(1-3), 2001, pp. 93-111
Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, beta and attenuation lengths
Authors: Seah, MP Gilmore, IS
Citation: Mp. Seah et Is. Gilmore, Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, beta and attenuation lengths, SURF INT AN, 31(9), 2001, pp. 835-846
Quantitative AES IX and quantitative XPS II: Auger and x-ray photoelectronintensities and sensitivity factors from spectral digital databases reanalysed using a REELS database
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Quantitative AES IX and quantitative XPS II: Auger and x-ray photoelectronintensities and sensitivity factors from spectral digital databases reanalysed using a REELS database, SURF INT AN, 31(8), 2001, pp. 778-795
Ion detection efficiency in SIMS: dependencies on energy, mass and composition for microchannel plates used in mass spectrometry
Authors: Gilmore, IS Seah, MP
Citation: Is. Gilmore et Mp. Seah, Ion detection efficiency in SIMS: dependencies on energy, mass and composition for microchannel plates used in mass spectrometry, INT J MASS, 202(1-3), 2000, pp. 217-229
Consistent, combined quantitative Auger electron spectroscopy and x-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Consistent, combined quantitative Auger electron spectroscopy and x-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment, J VAC SCI A, 18(4), 2000, pp. 1083-1088
Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure
Authors: Gilmore, IS Seah, MP
Citation: Is. Gilmore et Mp. Seah, Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure, APPL SURF S, 161(3-4), 2000, pp. 465-480
Static SIMS inter-laboratory study
Authors: Gilmore, IS Seah, MP
Citation: Is. Gilmore et Mp. Seah, Static SIMS inter-laboratory study, SURF INT AN, 29(9), 2000, pp. 624-637
Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS
Authors: Seah, MP Spencer, SJ Gilmore, IS Johnstone, JE
Citation: Mp. Seah et al., Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS, SURF INT AN, 29(1), 2000, pp. 73-81
Background subtraction - II. General behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPS
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Background subtraction - II. General behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPS, SURF SCI, 461(1-3), 2000, pp. 1-15
Signal linearity in XPS counting systems
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Signal linearity in XPS counting systems, J ELEC SPEC, 104(1-3), 1999, pp. 73-89
Static SIMS: metastable decay and peak intensities
Authors: Gilmore, IS Seah, MP
Citation: Is. Gilmore et Mp. Seah, Static SIMS: metastable decay and peak intensities, APPL SURF S, 145, 1999, pp. 26-30
Static SIMS: ion detection efficiencies in a channel electron multiplier
Authors: Gilmore, IS Seah, MP
Citation: Is. Gilmore et Mp. Seah, Static SIMS: ion detection efficiencies in a channel electron multiplier, APPL SURF S, 145, 1999, pp. 113-117
Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy, APPL SURF S, 145, 1999, pp. 132-136
Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers
Authors: Seah, MP Gilmore, IS Spencer, SJ
Citation: Mp. Seah et al., Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers, APPL SURF S, 145, 1999, pp. 178-182
Risultati: 1-14 |